Journal of Electronic Testing

, Volume 23, Issue 4, pp 341–355 | Cite as

IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection

  • Katherine Shu-Min Li
  • Chung-Len Lee
  • Chauchin Su
  • Jwu E Chen


A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests.


oscillation ring (OR) test scheme interconnect test SOC testing stuck-at faults open faults delay faults crosstalk glitches IEEE P1500 wrapper cell design 


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Copyright information

© Springer Science + Business Media, LLC 2007

Authors and Affiliations

  • Katherine Shu-Min Li
    • 1
  • Chung-Len Lee
    • 2
  • Chauchin Su
    • 3
  • Jwu E Chen
    • 4
  1. 1.Department of Computer Science and EngineeringNational Sun Yat-Sen UniversityKaohsiungRepublic of China
  2. 2.Department of Electronics EngineeringNational Chiao Tung UniversityHsinchuPeople’s Republic of China
  3. 3.Department of Electronic ControlNational Chiao Tung UniversityHsinchuPeople’s Republic of China
  4. 4.Department of Electrical EngineeringNational Central UniversityChungliPeople’s Republic of China

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