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Journal of Electronic Testing

, Volume 22, Issue 3, pp 219–228 | Cite as

A Low-Cost Jitter Measurement Technique for BIST Applications

  • Jiun-Lang Huang
  • Jui-Jer Huang
  • Yuan-Shuang Liu
Article

Abstract

In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior and circuit simulations are performed to validate the proposed technique and analyze the design tradeoffs, and preliminary measurement results on FPGA are also presented.

Keywords

random jitter built-in self-test jitter measurement 

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Copyright information

© Springer Science + Business Media, LLC 2006

Authors and Affiliations

  • Jiun-Lang Huang
    • 1
  • Jui-Jer Huang
    • 1
  • Yuan-Shuang Liu
    • 2
  1. 1.Graduate Institute of Electronics Engineering and Department of Electrical EngineeringNational Taiwan UniversityTaiwanR.O.C.
  2. 2.VIA Networking Technologies, Inc.TaipeiR.O.C.

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