Journal of Electronic Testing

, Volume 21, Issue 2, pp 161–168 | Cite as

Phase Shifter Merging



Phase shifters are used in conjunction with Linear Feedback Shift Registers and Cellular Automata in order to impose sufficient channel separations on the bit sequences produced by their successive cells. The aim is to reduce structural correlations and/or linear dependencies that are problematic for pseudorandom and pseudoexhaustive built-in test pattern generation (TPG). In this paper we present a synthesis approach that merges the logic of the original TPG mechanism with that of the required phase shifter network and yields a new compact structure that can offer lower area overhead and improved frequency of operation than the existing approach.


Test Pattern Generation (TPG) Built-in Self-Test (BIST) phase shifters linear feedback shift registers cellular automata 


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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  1. 1.Department of Electrical and Computer EngineeringSouthern Illinois UniversityCarbondaleUSA

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