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Journal of Electronic Testing

, Volume 21, Issue 6, pp 571–581 | Cite as

Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit

  • Jee-Youl Ryu
  • Bruce C. Kim
Analog and RF Design

Abstract

This paper presents a new low-cost RF BIST (Built-In Self-Test) scheme that is capable of measuring input impedance, gain, noise figure and input return loss for a low noise amplifier (LNA) in RF systems. The RF BIST technique requires an additional RF amplifier and two peak detectors, and its output is a DC voltage level. The BIST circuit is designed using 0.18 μm SiGe technology. The test technique utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the developed mathematical equations. Simulation results are presented for an LNA working at 5 GHz. Measurement data are compared with simulation results to validate the developed mathematical equations. The technique is simple and inexpensive.

Keywords

built-in self-test low noise amplifier output DC voltage RFIC 

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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  1. 1.Samsung SDI Co., Ltd.South Korea
  2. 2.University of Alabama

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