Structural and improved electrical properties of rare earth (Sm, Tb and Ho) doped BiFe0.975Mn0.025O3 thin films
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Pure BiFeO3 (BFO) and rare earth (RE) ion co-doped (Bi0.9RE0.1)(Fe0.975Mn0.025)O3 (RE = Sm, Tb and Ho, denoted by BSFM, BTFM and BHFM) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by using a chemical solution deposition method. Formations of distorted rhombohedral perovskite structure for the thin films were confirmed by using an X-ray diffraction and a Raman scattering analysis. Microstructural features for the thin films were examined by using a scanning electron microscopic analysis. Among the thin films, the lowest leakage current density of 1.22 × 10−6 A/cm2 (at 100 kV/cm), large remnant polarization (2Pr) of 72.4 μC/cm2 and low coercive field (2E c ) of 689 kV/cm (at 980 kV/cm) were measured for the BTFM thin film.
KeywordsSol–gel processes X-ray methods Ferroelectric properties Perovskites
This work was supported by the Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2010–0029634).