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Effect of re-oxidation on dielectric properties in Ni-MLCC

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Abstract

The effect of re-oxidation treatment on the solubility of dopants and the dielectric properties of rare-earths (La, Ho) and V-substituted BaTiO3 solid solutions, assuming the shell phase of X7R dielectrics, was investigated. Ho-V-substituted samples showed larger increase of the lattice parameter and T c by re-oxidation treatment compared with La-V-substituted samples. Electron spin resonance measurements revealed that the oxidation of V3+ to V4+ or V5+ appeared in the range in which the increase of lattice parameter by re-oxidation treatment was observed. This suggests that the increase of T c is due to the change of preferential occupational site of Ho ion from A-site to B-site, being accompanied with the oxidation of V3+. We also investigated the effect of re-oxidation treatment on the electrical properties and microstructure in Ni-MLCC samples, using rare-earths (La, Ho, Yb) and acceptors (Mn, V) doped BaTiO3 based X7R dielectrics. The change in temperature characteristic of the dielectric constant by re-oxidation treatment was observed for the MLCC samples containing V with smaller content. In the case of Ho-V- and Yb-V-doped samples showed larger increase of the dielectric constant at around 120 °C compared with La-V-doped samples. The relationship between the microstructure and electrical properties of the MLCC sample was investigated by impedance measurement at elevated temperature.

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References

  1. H. Kishi, Y. Mizuno, H. Chazono, Jpn. J. Appl. Phys. 42, 1–15 (2003)

    Article  ADS  CAS  Google Scholar 

  2. Y. Sakabe, K. Minai, K. Wakino, Jpn. J. Appl. Phys. Suppl. 20-4, 147–50 (1981)

    Google Scholar 

  3. Y. Nakano, A. Satoh, A. Hitomi, T. Nomura, Ceram. Trans. 32, 119–28 (1993)

    CAS  Google Scholar 

  4. H. Saito, H. Chazono, H. Kishi, N. Yamaoka, Jpn. J. Appl. Phys. 30, 2307–2310 (1991)

    Article  ADS  CAS  Google Scholar 

  5. H. Kishi, N. Kohzu, J. Sugino, H. Ohsato, Y. Iguchi, T. Okuda, J. Euro. Ceram. Soc. 19, 1043–1046 (1999)

    Article  CAS  Google Scholar 

  6. K. Albertsen, D. Hennings, O. Steigelmann, J. Electroceramics. 2(3), 193–198 (1998)

    Article  CAS  Google Scholar 

  7. H. Kishi, N. Kohzu, Y. Iguchi, J. Sugino, M. Kato, H. Ohsato, T. Okuda, Jpn. J. Appl. Phys. 39, 5533–5537 (2000)

    Article  ADS  CAS  Google Scholar 

  8. H. Kishi, N. Kohzu, J. Sugino, H. Ohsato, Y. Iguchi, T. Okuda, J. Euro. Ceram. Soc. 21, 1643–1647 (2001)

    Article  CAS  Google Scholar 

  9. H. Kishi, N. Kohzu, N. Ozaki, H. Ohsato, T. Okuda, Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics. 271–276 (2002)

  10. H. Toraya, J. Appl. Crystallogr. 16, 440–447 (1986)

    Article  Google Scholar 

  11. H. Ohsato, M. Imaeda, Y. Okino, H. Kishi, T. Okuda, Advances in X-ray Analysis, 40 (1997) (CD-ROM: International Centre for Diffraction Data)

  12. R. D. Shannon, Acta Crystallogr. A32, 751–767 (1976)

    ADS  CAS  Google Scholar 

  13. D. C. Sinclair, J. P. Attfield, Chem. Commun. 16, 1497–1498 (1999)

    Article  Google Scholar 

  14. D. Hennings, G. Rosenstein, J. Am. Ceram. Soc. 67(4) 249–254 (1984)

    Article  CAS  Google Scholar 

  15. H. Chazono, H. Kishi, Jpn. J. Appl. Phys. 40(9B) 5624–29 (2001)

    Article  ADS  CAS  Google Scholar 

  16. T. Tsurumi, H. Adachi, H. Kakemoto, S. Wada, Y. Mizuno, H. Chazono, H. Kishi, Jpn. J. Appl. Phys. 41, 6929–6933 (2002)

    Article  ADS  CAS  Google Scholar 

  17. L. E. Cross, Ferroelectrics 76, 241–267 (1987)

    CAS  Google Scholar 

Download references

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Authors and Affiliations

  1. General R&D laboratories, Taiyo Yuden Co. Ltd., 5607-2 Nakamuroda, Haruna-machi, Gunma-gun, Gunma, 370-3347, Japan

    Hiroshi Kishi, Youichi Mizuno, Tomoya Hagiwara & Hirokazu Orimo

  2. Department of Material Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showaku, Nagoya, 466-8555, Japan

    Hitoshi Ohsato

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  1. Hiroshi Kishi
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  2. Youichi Mizuno
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  3. Tomoya Hagiwara
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  4. Hirokazu Orimo
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  5. Hitoshi Ohsato
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Correspondence to Hiroshi Kishi.

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Kishi, H., Mizuno, Y., Hagiwara, T. et al. Effect of re-oxidation on dielectric properties in Ni-MLCC. J Electroceram 21, 22–28 (2008). https://doi.org/10.1007/s10832-007-9072-z

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