Abstract
X-ray photoelectron spectroscopy (XPS) was used to analyze the composition of films at different deposition parameters of sputtered Al-Ce coatings on AA6061 aluminum alloys. By means of electrochemical impedance spectroscopy (EIS) measurements, the protective character of these coatings was studied for 21 days of exposure in a 3.5 wt% NaCl solution and an attempt was made to establish the relationship between film thickness and chemical composition (Al/Ce, Ce3/Ce4+ ratios) of the surface before and after the electrochemical characterization. XPS studies revealed the presence of the Alo, Al2O3, CeO2 and Ce2O3 compounds, confirming that the sputtered Al-Ce films were deposited in the metallic form and thereafter were superficially oxidized under ambient conditions. The Al–Ce bonds were overlapped with the signal of cerium oxides. The transport phenomena in the oxide film or controlled diffusion process are strongly dependent on the deposition parameters and exposure time in the aggressive medium. It was also found that in the deposited samples at p4P200t300, the film was still present after 21 days of exposure, although with visible cracks and erosion areas; however, the Ce3/Ce4+ ratio almost remained constant before and after the electrochemical characterization, which explained the barrier properties of these samples as compared with others at different deposition parameters.
Similar content being viewed by others
References
Szklarska-Smialowska Z (1999) Corros Sci 41:1743
Sun X, Zhou X, Thompson GE, Skeldon P, Shimizu K, Furneaux RC, Scamans G (1998) Sixth international conference on aluminium alloys vol 3, p 1571
Davis JR (ed) (1999) Corrosion of aluminium and aluminium alloys. ASM International, Materials Park
Habazaki H, Shimizu K, Skeldon P, Thompson GE, Wood GC, Zhou X (1997) Corros Sci 39:731
Mujibur Rahman ABM, Kumar S, Gerson AR (2008) Corros Sci 50:1267
Voevodin N, Jeffcoate C, Simon L, Khobaib M, Donley M (2001) Surf Coat Technol 140:29
Sander LS, Musingo EM, Neill WJ (1990) US Patent 4,921,552
Das N (1992) US Patent 5,139,586
Miller RN (1994) US Patent 5,356,492
Tomlinson CE (1995) US Patent 5,380,374
Hinton BRW, Arnott DR, Ryan NE (1986) Mater Forum 9:162
Mansfeld F, Lin S, Kim S, Shih H (1989) Electrochim Acta 34:1123
Domínguez-Crespo MA, Rodil SE, Torres-Huerta AM, Ramírez-Meneses E, Suárez-Velázquez G (2009) Surf Coat Technol 204:571
Sheng HW, Liu HZ, Cheng YQ, Wen J, Lee PL, Luo WK, Shastri SD, Ma E (2007) Nat Mater 6:192
Mazurkiewicz B, Piotrowski A (1983) Corros Sci 23:697
Blanc C, Lavelle B, Mankowski G (1996) Mater Sci Forum 217:1559
Vyazovikina NV (1999) Protect Met 35:448
Okamoto G, Shibata T (1978) In: Frankenthal RP, Kruger J (eds) Passivity of metals, Corrosion monograph series, The Electrochemical Society, Pennington, NJ
Blanc C, Mankowski G (1997) Corros Sci 39:949
Blanc C, Lavelle B, Mankowski G (1997) Corros Sci 39:495
Aballe A, Bethencourt M, Botana FJ, Cano MJ, Marcos M (2001) Corros Sci 43:1657
Bethencourt M, Botana FJ, Calvino JJ, Marcos M, Rodriguez MA (1998) Mater Sci Forum 289–292:567
Ambat R, Dwarakadasa ES (1994) J Appl Electrochem 24:911
Wallinder D, Pan J, Leygraf C, Delblanc-Bauer A (1999) Corros Sci 41:275
Yu X, Li G (2004) J Alloys Compd 264:193
Pan M, Meng GY, Xin HW, Chen CS, Peng DK, Lin YS (1998) Thin Solid Films 324:89
Pardo A, Merino MC, Arrabal R, Viejo F, Munoz JA (2007) Appl Surf Sci 253:3334
Teterin YA, Teterin AY, Lebedev AM, Utkin IO (1998) J Electron Spectrosc Relat Phenom 88–91:275
Arnott DR, Ryan NE, Hinton BRW, Sexton BA, Hughes AE (1985) Appl Surf Sci 22–23:236
Yu X, Li G (2004) J Alloys Compd 364:193
Domínguez-Crespo MA, Torres-Huerta AM, Rodil SE, Ramírez-Meneses E, Suárez-Velázquez G, Hernández-Pérez MA (2009) Electrochim Acta 55:498
Goeminne G, Terryn H, Vereecken J (1998) Electrochim Acta 43:1829
Campestrini P, Westing V, Wit JH (2001) Electrochim Acta 46:2631
Goeminne G, Terryn H, Vereecken J (1995) Electrochim Acta 40:479
Moutarlier V, Gigandet MP, Normand, Pagetti BJ (2005) Corros Sci 47:937
Palomino LEM, Aoki IV, de Melo HG (2006) Electrochim Acta 51:5943
López DA, Simison SN, de Sánchez SR (2005) Corros Sci 47:735
Bilkova K, Hackerman N, Bartos M (2002) Proceedings of the NACE corrosion, paper no. 2284, Denver, CO
Scully JR (1993) Electrochemical impedance: analysis and interpretation. ASTM STP 1188, p 26
Bessone JB, Salinas DR, Mayer CE, Ebert M, Lorenz WJ (1992) Electrochim Acta 37:2283
Xingwen Y, Chunan C, Zhiming Y, Derui Z, Zhongda Y (2001) Corros Sci 43:1283
Hughes AE, Gorman JD, Patterson PJK (1996) Corros Sci 38:1957
Gorman JD, Jhonson ST, Joghnston PN, Patterson PJK, Hughes AE (1996) Corros Sci 38:1977
Scully JC (1990) The fundaments of corrosion, 3rd edn. Pergamon Press, Oxford
Zaid B, Saidi D, Benzaid A, Hadji S (2008) Corros Sci 50:1841
Meng G, Wei L, Zhang T, Shao Y, Wang F, Dong C, Li X (2009) Corros Sci 51:2151
Ren J, Zuo Y (2005) Surf Coat Technol 191:311
Yu SY, O’Grady WE, Ramaker DE, Natishan PM (2000) J Electrochem Soc 147:2952
Pyun SI, Lee WJ (2001) Corros Sci 43:153
Moutarlier V, Gigandet MP, Pagetti J (2003) Appl Surf Sci 206:237
Zhang H, Zuo Y (2008) Appl Surf Sci 254:4930
Acknowledgments
This study has been financially supported by CONACYT (project number 61354), IPN (projects number SIP-2009-0561, 2009-0499) and SNI. The authors would like to thank Mr. Javier Zapata Torres for his technical support.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Domínguez-Crespo, M.A., Torres-Huerta, A.M., Rodil, S.E. et al. XPS and EIS studies of sputtered Al–Ce films formed on AA6061 aluminum alloy in 3.5% NaCl solution. J Appl Electrochem 40, 639–651 (2010). https://doi.org/10.1007/s10800-009-0039-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10800-009-0039-4