Advertisement

Journal of Applied Electrochemistry

, Volume 38, Issue 5, pp 729–729 | Cite as

O. Tabata and T. Tsuchiya (eds.): Reliability of MEMS: Testing of Materials and Devices

Wiley-VCH, Weinheim, xx + 303 pp, £110, ISBN 978-3-527-31494-2
  • S. M. Spearing
Book Review
  • 101 Downloads

Copyright information

© Springer Science+Business Media B.V. 2008

Authors and Affiliations

  1. 1.School of Engineering SciencesUniversity of SouthamptonSouthamptonUK

Personalised recommendations