Skip to main content
Log in

Electrical properties of films grown on W and Mo substrates by titanium ion implantation in nitrogen atmosphere

  • Published:
Inorganic Materials Aims and scope

Abstract

Films consisting of alternating nitride and oxide layers differing in phase composition and structure are grown on polycrystalline tungsten and molybdenum substrates by ion implantation. The resistivity and thermoelectric power of the films are measured as functions of temperature, and the temperature coefficient of their resistance is determined. The phase composition and electrical properties of the films are shown to be governed by the nitrogen-ion dose delivered to the titanium target.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

REFERENCES

  1. Toth, L., Transition Metal Carbides and Nitrides, New York: Academic, 1971. Translated under the title Karbidy i nitridy perekhodnykh metallov, Moscow: Mir, 1974.

    Google Scholar 

  2. Chena, G.S., Lee, P.Y., and Chena, S.T., Phase Formation Behavior and Diffusion Barrier Property of Reactively Sputtered Tantalum-Based Thin Films Used in Semiconductor Metallization, Thin Solid Films, 1999, vol. 353, no.1, pp. 264–273.

    Google Scholar 

  3. Moiseev, V.F., Fuks-Rabinovich, G.S., Dosbaeva, G.K., et al., Effect of Nitrogen on the Structure and Properties of Surface-Hardening Ti-Based Coatings, Fiz. Khim. Obrab. Mater., 1991, no. 2, pp. 118–121.

  4. Nie, H.B., Xu, S.Y., Wang, S.J., et al., Structural and Electrical Properties of Tantalum Nitride Thin Films Fabricated by Using Reactive Radio-Frequency Magnetron Sputtering, Appl. Phys. A, 2001, vol. 73, pp. 229–236.

    Article  CAS  Google Scholar 

  5. Tsai, W., Delfino, M., Fair, J.A., and Hodul, D., Temperature Dependence of the Electrical Resistivity of Reactively Sputtered TiN Films, J. Appl. Phys., 1993, vol. 73, no.9, pp. 4462–4467.

    CAS  Google Scholar 

  6. Le Clair, P., Berera, G.P., and Mooder, J.S., Titanium Nitride Thin Films Obtained by a Modified Physical Vapor Deposition Process, Thin Solid Films, 2000, vol. 376, no.1, pp. 9–15.

    Google Scholar 

  7. Deen, M.J., The Effect of the Deposition Rate on the Properties of D.C.-Magnetron Sputtered Niobium Thin Films, Thin Solid Films, 1987, vol. 152, pp. 535–544.

    CAS  Google Scholar 

  8. Igasaki, Y. and Mitsuhashi, H., The Effect of Substrate Bias on the Structural and Electrical Properties of TiN Films Prepared by Reactive r.-f. Sputtering, Thin Solid Films, 1980, vol. 70, pp. 17–25.

    CAS  Google Scholar 

  9. Sundgren, J.-E., Structure and Properties of TiN Coatings, Thin Solid Films, 1985, vol. 128, pp. 21–44.

    CAS  Google Scholar 

  10. Chang, C.-C., Jeng, J.S., and Chen, J.S., Microstructural and Electrical Characteristics of Reactively Sputtered Ta-N Thin Films, Thin Solid Films, 2002, vol. 413, pp. 46–51.

    CAS  Google Scholar 

  11. Nowak, R. and Maruno, S., Surface Deformation and Electrical Properties of HfN Thin Films Deposited by Reactive Sputtering, Mater. Sci. Eng., A, 1995, vol. 202, pp. 226–237.

    Google Scholar 

  12. Andrievskii, R.A., Synthesis and Properties of Films of Interstitial Compounds, Usp. Khim., 1997, vol. 66, no.1, pp. 57–77.

    Google Scholar 

  13. Belous, M.B., Grankina, L.P., Permyakov, V.G., and Proleeva, Ya.N., Electrical Properties of Thin Nichrome Films: II. Temperature Coefficient of Resistance, Fiz. Met. Metalloved., 1965, vol. 19, no.6, pp. 840–844.

    CAS  Google Scholar 

  14. Myers, S., Ion-Implanted Metallic Layers, Thin Films: Interdiffusion and Reactions, Poate, J., Tu, K., and Mayer, J., Eds., New York: Wiley, 1978. Translated under the title Tonkie plenki. Vzaimnaya diffuziya i reaktsii, Moscow: Mir, 1982, pp. 539-572.

    Google Scholar 

  15. Vasil’ev, I.P., Zlobin, V.N., and Bondarenko, V.I., Ion Implantation of Catalysts, Tr. Ukr. Vak. O-va., 1997, vol. 3, pp. 70–72.

    Google Scholar 

  16. Ignatenko, P.I., Klyakhina, N.A., and Badekin, M.Yu., Phase Composition, Growth Kinetics, and Properties of Mo-N, W-N, and Ta-N Coatings Deposited by Reactive Sputtering, Materialovedenie, 2003, no. 4, pp. 36–42.

Download references

Author information

Authors and Affiliations

Authors

Additional information

Translated from Neorganicheskie Materialy, Vol. 41, No. 3, 2005, pp. 301–304.

Original Russian Text Copyright © 2005 by Ignatenko, Badekin.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ignatenko, P.I., Badekin, M.Y. Electrical properties of films grown on W and Mo substrates by titanium ion implantation in nitrogen atmosphere. Inorg Mater 41, 243–246 (2005). https://doi.org/10.1007/s10789-005-0117-x

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10789-005-0117-x

Keywords

Navigation