International Journal of Thermophysics

, Volume 36, Issue 5–6, pp 1236–1243 | Cite as

Numerical Simulation Study of Defect Detections by Using Laser Array Generated Giant Acoustic Waves

  • C. Ni
  • L. Dong
  • Z. Shen
  • X. Ni
  • D. Shi


Based on the classical theory of laser ultrasound generation in a thermoelastic regime, the generation of ultrasound by laser array source irradiation is simulated by the finite element method. The propagation and interaction of the laser-generated ultrasound with a bulk defect are studied. By changing the trigger time delay of a spatially evenly distributed laser array source, giant bulk waves with specific wavefronts and amplitudes several times larger than those of waves generated by a single laser source can be obtained. The interaction between giant acoustic waves and a bulk defect is compared with that in the model without the defect obtained under the same conditions. Results show that compared with a single-pulse generated acoustic wave, the detectability of multiple-source generated giant acoustic waves to defects can be improved significantly.


Finite element method Laser array source Laser ultrasonics Micro-crack 



This paper is supported by the National Natural Science Foundation of China under Grant No. 61405093, the Natural Science Foundation of Jiangsu Province under Grant No. BK20140771, and financial support for the start-up scientific research of Nanjing University of Science and Technology.


  1. 1.
    C. Ni, Y. Shi, Z. Shen, J. Lu, Jpn. J. Appl. Phys. 49, 046603 (2010)ADSCrossRefGoogle Scholar
  2. 2.
    C. Ni, L. Wang, Z. Shen, J. Lu, X. Ni, Nondestr. Test. Eval. 25, 111 (2010)CrossRefGoogle Scholar
  3. 3.
    A.M. Lomonosov, P. Hess, R.E. Kumon, M.F. Hamilton, Phys. Rev. B 69, 035314 (2004)ADSCrossRefGoogle Scholar
  4. 4.
    A.K. Kromine, P.A. Fomitchov, S. Krishnaswamy, J.D. Achenbach, Mater. Eval. 56, 173 (2000)Google Scholar
  5. 5.
    Y. Sohn, S. Krishnaswamy, J. Acoust. Soc. Am. 115, 172 (2004)ADSCrossRefGoogle Scholar
  6. 6.
    Y. Matsuda, H. Nakano, S. Nagai, Appl. Phys. Lett. 89, 171902 (2006)ADSCrossRefGoogle Scholar
  7. 7.
    X. Jian, Y. Fan, R.S. Edwards, S. Dixon, J. Appl. Phys. 100, 064907 (2006)ADSCrossRefGoogle Scholar
  8. 8.
    C. Ni, Y. Shi, Z. Shen, J. Lu, X. Ni, NDT & E Int. 43, 470 (2010)CrossRefGoogle Scholar
  9. 9.
    C. Ni, L. Dong, Z. Shen, J. Lu, Opt. Laser Technol. 43, 1391 (2011)ADSCrossRefGoogle Scholar
  10. 10.
    S. Dixon, B. Cann, D.L. Carroll, Y. Fan, R.S. Edwards, Nondestr. Test. Eval. 23, 25 (2008)CrossRefGoogle Scholar
  11. 11.
    Q. Shan, R.J. Dewhurst, Appl. Phys. Lett. 62, 2649 (1993)ADSCrossRefGoogle Scholar
  12. 12.
    J. Huang, S. Krishnaswamy, J.D. Achenbach, J. Acoust. Soc. Am. 92, 2527 (1992)ADSCrossRefGoogle Scholar
  13. 13.
    T.W. Murray, K.C. Baldwin, J.W. Wagner, J. Acoust. Soc. Am. 102, 2742 (1997)ADSCrossRefGoogle Scholar
  14. 14.
    Y.H. Liu, T.T. Wu, C.K. Lee, J. Acoust. Soc. Am. 111, 2638 (2002)ADSCrossRefGoogle Scholar
  15. 15.
    L. Dong, C. Ni, Z. Shen, X. Ni, Acoust. Phys. 57, 730 (2011)ADSCrossRefGoogle Scholar
  16. 16.
    M.H. Noroy, D. Royer, M. Fink, Appl. Phys. Lett. 63, 3276 (1993)ADSCrossRefGoogle Scholar
  17. 17.
    C. Chenu, M.H. Noroy, D. Royer, Appl. Phys. Lett. 65, 1091 (1994)ADSCrossRefGoogle Scholar
  18. 18.
    M.H. Noroy, D. Royer, M. Fink, J. Acoust. Soc. Am. 94, 1934 (1993)ADSCrossRefGoogle Scholar
  19. 19.
    T.W. Murray, M. Marincek, J.W. Wagner, in Proceedings of IEEE Ultrasonics Symposium, vol. 2, Baltimore, MD, pp. 623–626 (1993)Google Scholar
  20. 20.
    T.W. Murray, J.B. Deaton Jr, J.W. Wagner, Ultrasonics 34, 69 (1996)CrossRefGoogle Scholar
  21. 21.
    A. Kita, I.C. Ume, J. Nondestr. Eval. 26, 11 (2007)CrossRefGoogle Scholar
  22. 22.
    M. Duquennoy, M. Ouaftouh, M. Ourak, NDT & E Int. 32, 189 (1999)CrossRefGoogle Scholar
  23. 23.
    J. Cheng, S. Zhang, Appl. Phys. Lett. 74, 2087 (1999)ADSCrossRefGoogle Scholar
  24. 24.
    B. Xu, Z. Shen, X. Ni, J. Lu, J. Appl. Phys. 95, 2116 (2004)ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  1. 1.School of Electronic Engineering and Optoelectronic TechniquesNanjing University of Science and TechnologyNanjingChina
  2. 2.Institute of Research of Iron and SteelSha-SteelZhangjiagangChina
  3. 3.Department of PhysicsNanjing University of Science and TechnologyNanjingChina
  4. 4.Department of PhysicsNanjing University of Aeronautics and AstronauticsNanjingChina

Personalised recommendations