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International Journal of Thermophysics

, Volume 32, Issue 3, pp 720–728 | Cite as

Optical, Structural, and Photocarrier Studies of Cu x (CdTe) y O z Thin Films

  • R. Velazquez-Hernandez
  • I. Rojas-Rodriguez
  • J. Carmona-Rodríguez
  • S. Jiménez-Sandoval
  • M. E. Rodriguez-Garcia
Article

Abstract

In this research quaternary alloy thin films made of Cu, CdTe, and O have been grown and characterized. The samples used in this investigation were grown simultaneously by reactive RF co-sputtering and by introducing oxygen and argon in the chamber during growth and changing the power in the Cu target from 10 W to 50 W. The carrier distribution as a function of the position was studied by using energy dispersive spectroscopy–scanning electronic microscopy (EDS–SEM), micro-Raman spectroscopy, and photocarrier images. Structural characterization was carried out by using X-ray diffraction. According to the results, a lateral carrier distribution was found in all samples and a new phase identified as Cu2Te was revealed for samples grown at 50 W.

Keywords

Electronic distributions Nondestructive techniques Photocarrier Radiometry Thin films 

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • R. Velazquez-Hernandez
    • 1
  • I. Rojas-Rodriguez
    • 2
  • J. Carmona-Rodríguez
    • 3
  • S. Jiménez-Sandoval
    • 3
  • M. E. Rodriguez-Garcia
    • 4
  1. 1.División de Investigación y Posgrado, Facultad de IngenieríaUniversidad Autónoma de QuerétaroQuerétaroMexico
  2. 2.Universidad Tecnológica de Querétaro, MéxicoQuerétaroMexico
  3. 3.Centro de Investigación y de Estudios Avanzados del IPNUnidad QuerétaroQuerétaroMexico
  4. 4.Departamento de Nanotecnología, Centro de Física Aplicada y Tecnología AvanzadaUniversidad Nacional Autónoma de MéxicoQuerétaroMexico

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