Advertisement

International Journal of Thermophysics

, Volume 28, Issue 6, pp 2111–2117 | Cite as

A New Method to Determine the Size-of-Source Effect

  • M. Bart
  • E. W. M. van der Ham
  • P. Saunders
Article

Abstract

This article introduces a new technique for measuring the size-of-source effect in radiation thermometers. It is based on scanning a thermometer across an aperture and extracting the size-of-source effect data from the residual signal, and is similar to the commonly used indirect method. The method has several advantages including speed, an ability to cover wide angles, and amenability to automation, at the expense of some added mathematical complexity. Results compare favorably with the frequently used indirect method of measuring the size-of-source effect.

Keywords

Field of view Radiation thermometry Size-of-source effect 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    G. Machin, R. Sergienko, in Proc. Tempmeko 2001, 8th Int. Symp. on Temperature and Thermal Measurements in Industry and Science (VDE Verlag, Berlin, 2002), pp. 155–160Google Scholar
  2. 2.
    M.S. Matveyev, in Proc. Tempmeko 2001, 8th Int. Symp. on Temperature and Thermal Measurements in Industry and Science (VDE Verlag, Berlin, 2002), pp. 167–171Google Scholar
  3. 3.
    S.N. Park, J.T. Kim, in Proc. Tempmeko 2001, 8th International Symposium on Temperature and Thermal Measurements in Industry and Science (VDE Verlag, Berlin, 2002), pp. 173–177Google Scholar
  4. 4.
    G. Machin, M. Ibrahim, in Proc. Tempmeko 1999, 7th International Symposium on Temperature and Thermal Measurements in Industry and Science (Edauw Johannissen bv, Delft, 1999), pp. 687–692Google Scholar
  5. 5.
    G. Machin, M. Ibrahim, in Proc. Tempmeko 1999, 7th International Symposium on Temperature and Thermal Measurements in Industry and Science (Edauw Johannissen bv, Delft, 1999), pp. 681–686Google Scholar
  6. 6.
    F. Sakuma, L. Ma, Z. Yuan, in Proc. Tempmeko 2001, 8th International Symposium on Temperature and Thermal Measurements in Industry and Science (VDE Verlag, Berlin, 2002), pp. 161–166Google Scholar
  7. 7.
    Lowe D., Battuello M., Machin G., Girard F. (2003) Temperature: Its Measurement and Control in Science and Industry, vol. 7 AIP, Chicago, pp 625–630Google Scholar
  8. 8.
    K.D. Hill, J.D. Woods, in Proc. Tempmeko 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science (FSB/LPM, Zagreb, Croatia, 2004), pp. 599–604Google Scholar
  9. 9.
    P. Bloombergen, in Proc. Tempmeko 1999, 7th International Symposium on Temperature and Thermal Measurements in Industry and Science (Edauw Johannissen bv, Delft, 1999), pp. 607–612Google Scholar
  10. 10.
    H.W. Yoon, D.W. Allen, R.D. Saunders, in Proc. Tempmeko 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science (FSB/LPM, Zagreb, Croatia, 2004), pp. 521–526Google Scholar
  11. 11.
    E. Schreiber, G. Neuer, in Proc. Tempmeko 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science (FSB/LPM, Zagreb, Croatia, 2004), pp. 527–532Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  1. 1.Measurement Standards Laboratory of New ZealandIndustrial Research LtdLower HuttNew Zealand
  2. 2.Nederlands Meetinstiuut – van Swinden LaboratoriumDelftThe Netherlands

Personalised recommendations