A Free-Space Measurement Technique of Terahertz Dielectric Properties

  • Xiansheng Zhang
  • Tianying Chang
  • Hong-Liang Cui
  • Zhonglin Sun
  • Chuanfa Yang
  • Xiuwei Yang
  • Lingyu Liu
  • Wei Fan


The free-space method for material dielectric characterization in the microwave band is extended to terahertz frequencies. By analyzing the advantages and disadvantages of the relative permittivity of the transmission/reflection method for non-magnetic materials, a fast calculation method using a transmission-only method is proposed. Based on the convergence analysis of the algorithm, a method to estimate the initial value is also proposed. Finally, through measurements of the permittivity of high-density polyethylene, polystyrene, polypropylene, and polymethyl methacrylate in the 325–500 GHz band, we verify the rationality of the algorithm and demonstrate its applicability. Through the combination of the two methods, the terahertz dielectric properties of a majority of flat non-conducting solid materials and non-polar liquid materials can be measured.


Terahertz Free space Calibration Transmission-only method Initial value estimate 



This work is supported by the Department of Science and Technology of Shandong Province (Project Numbers 2015GGX101030 and 2016GGX101010), the Ministry of Science and Technology of China (Project Number 2015DFA11200), and the Shandong Provincial Natural Science Foundation (Project Number ZR2014FP007), the Youth Science Funds of Shandong Academy of Sciences, and the Innovation Program of the Shandong Academy of Sciences.


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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • Xiansheng Zhang
    • 1
  • Tianying Chang
    • 1
    • 2
  • Hong-Liang Cui
    • 2
  • Zhonglin Sun
    • 1
  • Chuanfa Yang
    • 1
  • Xiuwei Yang
    • 1
  • Lingyu Liu
    • 1
  • Wei Fan
    • 2
  1. 1.Institute of AutomationShandong Academy of SciencesJinanChina
  2. 2.College of Instrumentation and Electrical EngineeringJilin UniversityChangchunChina

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