A Free-Space Measurement Technique of Terahertz Dielectric Properties
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The free-space method for material dielectric characterization in the microwave band is extended to terahertz frequencies. By analyzing the advantages and disadvantages of the relative permittivity of the transmission/reflection method for non-magnetic materials, a fast calculation method using a transmission-only method is proposed. Based on the convergence analysis of the algorithm, a method to estimate the initial value is also proposed. Finally, through measurements of the permittivity of high-density polyethylene, polystyrene, polypropylene, and polymethyl methacrylate in the 325–500 GHz band, we verify the rationality of the algorithm and demonstrate its applicability. Through the combination of the two methods, the terahertz dielectric properties of a majority of flat non-conducting solid materials and non-polar liquid materials can be measured.
KeywordsTerahertz Free space Calibration Transmission-only method Initial value estimate
This work is supported by the Department of Science and Technology of Shandong Province (Project Numbers 2015GGX101030 and 2016GGX101010), the Ministry of Science and Technology of China (Project Number 2015DFA11200), and the Shandong Provincial Natural Science Foundation (Project Number ZR2014FP007), the Youth Science Funds of Shandong Academy of Sciences, and the Innovation Program of the Shandong Academy of Sciences.
- 1.X. M. Liu, “Dielectric and measurement techniques,” (Beijing University of Posts and Telecommunications, Beijing, 2015), pp. 40–46Google Scholar
- 2.L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, “Microwave Electronics: Measurement and Materials Characterization,” West Sussex, U. K. Wiley, 2004.Google Scholar
- 6.“Agilent Technologies: Basics of Measuring the Dielectric Properties of Materials,” Measurement Techniques: Application Note, 5989–2589EN, 2005.Google Scholar
- 7.H. S. Ku, J. A. R. Ball, E. Siores, and P. Chan, “Microwave Processing and Permittivity Measurement of Thermoplastic Composites at Elevated Temperatures,” In: 12th International Conference on Composite Materials, pp. 5–9, 1999.Google Scholar
- 11.M. Imparato, T. Weller, L. Dunleavy. “On-wafer calibration using space-conservative (SOLT) standards”, Int. Microwave Symp. Dig., 4(4): 1643–1646, 1999.Google Scholar
- 12.I. Rolfes, and B. Schiek, “Calibration methods for microwave free space measurements,” Radio Sci., 13(1): 3–8, 1984.Google Scholar
- 13.T. F. Dion, “W-band Free Space Permittivity Measurement Setup for Candidate Radome Materials”, NASA Contractor Report 201720 Contract NASA1-96014, pp. 1–9, 1997.Google Scholar
- 14.P. G. Bartley, and S. B. Begley, “A new free-space calibration technique for materials measurement,” IEEE International Instrumentation & Measurement Technology Conference, pp. 47–51, 2012.Google Scholar
- 15.F. H. Wee, P. J. Soh, A. H. M. Suhaizal, H. Nornikman, and A. A. M. Ezanuddin, “Free Space Measurement Technique on Dielectric Properties of Agricultural Residues at Microwave Frequencies,” International Microwave and Optoelectronics Conference (IMOC 2009), Belem, Brazil, pp. 182–187, 2009.Google Scholar
- 26.A. Kazemipour, M. Hudlicka, M. Salhi, and T. Kleine-Ostmann, “Free-space quasi-optical spectrometer for material characterization in the 50–500 GHz frequency range,” 44th European Microwave Conference, pp. 636–639, 2014.Google Scholar
- 27.Y. S. Jin, G. J. Kim, and S. G. Jeon, “Terahertz dielectric properties of polymers,” J. Korean Phys. Soc., 49(2):513–517, 2006.Google Scholar