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Millimeter Wave Measurement of the Low-Loss Dielectric in Vacuum Electronic Devices with Reflection-Type Hemispherical Open Resonator

  • G. X. Shu
  • Y. Luo
  • Q. S. Zhang
  • J. Su
  • L. Wang
  • Y. Xu
  • S. F. Wang
Article

Abstract

Accurate dielectric properties are of great importance for the design and fabrication of the input and output windows in vacuum electronic devices. A reflection-type hemispherical open resonator (RTHOR) was designed through theoretical analysis and numerical simulation and also was utilized to measure the dielectric properties of the windows material sapphire. Compared with the two ports measurement, a simplified measurement system to obtain the dielectric performance was proposed and the RTHOR with only one coupling aperture was directly connected to a W-band vector network analyzer (VNA). The material properties can be easily calculated through the VNA measured port reflection coefficient (S11) resonant curve. Investigation shows that the permittivity and the loss tangent of the measured sapphire, which is used to construct the input and output window, is respectively about 9.40 and 1.80 × 10−4 at room temperature in W-band, which agree well with the reported results. Measured results also show that the simplified measurement system can provide a high accuracy for the measurement of low-loss dielectric in a relatively convenient way.

Keywords

Reflection-type hemispherical open resonator (RTHOR) Complex permittivity measurement Low-loss dielectric Millimeter wave (mm-wave) Vacuum electronic devices (VEDs) 

References

  1. 1.
    R. Yan, Y. Tang, Y. Luo, Design and experimental study of a high-gain W-band gyro-TWT with nonuniform periodic dielectric loaded waveguide. IEEE Trans. Electron Devices. 61(7), 2564-2569 (2014).CrossRefGoogle Scholar
  2. 2.
    Tomasz Rzesnicki, Bernhard Piosczyk, Stefan Kern et al. 2.2-MW record power of the 170-GHz European preprototype coaxial-cavity gyrotron for ITER. IEEE Trans. on Plasma Science, 38(63), 1141–1149 (2010).CrossRefGoogle Scholar
  3. 3.
    M. N. Afsar and H. Chi, Windows materials for high power gyrotron. Int. J. Infrated Millimeter Waves. 15(7), 1161–1179 (1994).CrossRefGoogle Scholar
  4. 4.
    B. B. Yang, S. L. Katz, K. J. Willis, et al., A high-Q Terahertz resonator for the measurement of electronic properties of conductors and low-loss dielectrics. IEEE Trans. Terahertz Science and Technology. 2 (4), 449–459 (2012).CrossRefMATHGoogle Scholar
  5. 5.
    Y. F Gui, W. B. Dou, K. Yin, Open resonator technique of non-planar dielectric objects at millimeter wavelengths. Progress in Electromagnetic Research M. 9, 185–197 (2009).Google Scholar
  6. 6.
    J. J. Choi, Dielectric measurements of CVD diamonds at millimeter wavelength using a Fabry-Perot open resonator. Int.J Infrated and Millimeter waves. 26(10). 1427–1436 (2005).CrossRefGoogle Scholar
  7. 7.
    Y. F. Gui, W. B. Dou, K. Yin, and P. G. Su, Open resonator system for automatic and precise dielectric measurement at millimeter wavelengths. Int.J Infrated and Millimeter waves. 29, 782–791 (2008).CrossRefGoogle Scholar
  8. 8.
    T. M. Hirvonen, P. Vainikainen, A. Lozowski, and A. V. Raisanen, Measurement of dielectrics at 100GHz with an open resonator connected to a network analyzer. IEEE Trans. Instrum. Meas. 45(4), 780–786 (1996).CrossRefGoogle Scholar
  9. 9.
    Y. L. Luo, High Q-factor open resonator measurement system for 94 GHz waveband applications. IEE Proc.-Microw. Antennas Propag. 142(5), 414–416 (1995).CrossRefGoogle Scholar
  10. 10.
    S. N. Dmitri, V. Lioubtchenko, J. A. Mallat and A.V. Räisänen, Millimeter-wave permittivity measurement of deposited dielectric films using the spherical open resonator. IEEE Microwave and Wireless Components Letters. 15(9), 564–566 (2005).CrossRefGoogle Scholar
  11. 11.
    C. R. Jones, J. Dutta, G. F Yu and Y. C. Gao, Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths. J Infrared Milli Terahz Waves. 32, 838–847 (2011).CrossRefGoogle Scholar
  12. 12.
    F. R. Cui, Z. X. Luo, F. Ji, B. J. Hu, and S. I. Lai. Quasi optical resonator for measuring surface resistance and its distribution of high temperature superconductor film. Int. J Infrated and Millimeter waves. 20(6), 1037–1045 (1999).CrossRefGoogle Scholar
  13. 13.
    M. N. Afsar, H. Y. Ding, A novel open-resonator system for precise measurement of permittivity and loss-tangent. IEEE Tran. Instrum. Meas. 50(2), 402–405 (2001).CrossRefGoogle Scholar
  14. 14.
    M. N. Afsar, H. Y. Ding, K. Tourshan, A new 60GHz open resonator technique for precision permittivity and loss tangent measurement. IEEE Trans. Instrum. Meas. 48(2), 626–630 (1999).CrossRefGoogle Scholar
  15. 15.
    R. G. Jones. Precise dielectric measurements at 35GHz using an open microwave resonator. Proc. IEE. 123(4), 285–290 (1976).Google Scholar
  16. 16.
    Y. C. Gao, C. R. Jones, and J. M. Dutta, Phase locked BWO system for open resonator measurement in D-band. IEEE Microwave and Wireless Components Letters. 19(9), 599–601 (2009).CrossRefGoogle Scholar
  17. 17.
    H. Kogelnik, T. Li, Laser beams and resonators. Proc. IEEE. 54(10), 1312–1329 (1966).CrossRefGoogle Scholar
  18. 18.
    P. K. Yu and A. L. Cullen, Measurement of permittivity by means of an open resonator: I. Theoretical. Proc. R. Soc. Lond. A. 380, 49–71 (1982).CrossRefGoogle Scholar
  19. 19.
    R. K. Mongia and R. K. Arora, Equivalent circuit parameters of an aperture coupled open resonator cavity. IEEE Trans. Microwave Theory Tech. 41, 1245–1250 (1993).CrossRefGoogle Scholar
  20. 20.
    G. Faby and K. Schunemann, Q-factor measurements of open resonators in the millimeter-wave range including coupling losses, IEEE Trans. Instrum. Meas. 48(3), 688–692 (1999).CrossRefGoogle Scholar
  21. 21.
    R. Heidinger, Dielectric measurements on sapphire for electron cyclotron wave systems. J. of Nucl. Mat. 212–215, 1101–1106 (1994).CrossRefGoogle Scholar
  22. 22.
    V. V. Parshin, Dielectric materials for gyrotron output windows. Int. J. Infrared Millimeter Waves. 15(2), 339–348 (1994).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2015

Authors and Affiliations

  1. 1.School of Physical electronicsUniversity of Electronic Science and Technology of ChinaChengduChina
  2. 2.North Electronic Device Research InstitutionBeijingChina

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