Measurement of Low-Loss Dielectric Materials Using Dielectric Rod Resonator
To obtain the complex permittivity of low-loss dielectric materials at 60 GHz, a measurement method is developed. Using a dielectric rod resonator excited by a dielectric waveguide, effective conductivity of conducting plates for short circuiting the resonator is determined. The complex permittivity of the dielectric rod is determined by the resonant frequency and unloaded quality factor of the TE0m1-mode resonator. Moreover, the complex permittivity of single crystal sapphire, polycrystalline ceramics, and cordierite has been investigated in virtue of numerical simulation. For all the measured specimens in this study, the proposed method is seen to provide much better accuracy for values.
KeywordsComplex permittivity Dielectric rod resonator Millimeter wave
- 4.P. Coquet, T. Matsui, and M. Kiyokawa, Dielectric measurements in the 60-GHz band using a high-QGaussian beam open resonator, IEICE Trans. Electron. E78-C(no. 8) 1125–1130 (1995), Aug.Google Scholar
- 5.G. Zhang, S. Nakaoka, and Y. Kobayashi, Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by the cavity resonance method, IEEE Proc. Asia-Pacific Microwave Conf. 3, 913–916 (1997), Dec.Google Scholar
- 6.N. Hiramatsu, T. Kishino, T. Okamura, H. Kii, and D. A. Sagala, Nonradiative dielectric waveguide using cordierite ceramics, IEEE MTT-S Int. Microwave Symp. Dig. 4, 1785–1788 (1999), June.Google Scholar