Measurement of Low-Loss Dielectric Materials Using Dielectric Rod Resonator

  • Li-Qiang Wang
  • Hong-Xing Zheng
  • Li-Ying Feng
  • Feng-You Gao


To obtain the complex permittivity of low-loss dielectric materials at 60 GHz, a measurement method is developed. Using a dielectric rod resonator excited by a dielectric waveguide, effective conductivity of conducting plates for short circuiting the resonator is determined. The complex permittivity of the dielectric rod is determined by the resonant frequency and unloaded quality factor of the TE0m1-mode resonator. Moreover, the complex permittivity of single crystal sapphire, polycrystalline ceramics, and cordierite has been investigated in virtue of numerical simulation. For all the measured specimens in this study, the proposed method is seen to provide much better accuracy for values.


Complex permittivity Dielectric rod resonator Millimeter wave 


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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • Li-Qiang Wang
    • 1
  • Hong-Xing Zheng
    • 1
  • Li-Ying Feng
    • 1
  • Feng-You Gao
    • 1
  1. 1.Department of Electronic EngineeringTianjin University of Technology and EducationTianjinPeople’s Republic of China

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