Abstract
At Central Michigan University, we are developing a high-precision Penning trap mass spectrometer (CHIP-TRAP) for precise mass measurements with stable and long-lived isotopes. Ions will be produced using external ion sources and then transported to the Penning trap at low energy using electrostatic ion optics. Ion sources that will be utilized with CHIP-TRAP include a laser ablation ion source (LAS) that has already been commissioned, and a low current Penning ion trap (PIT) source that is currently being developed. The LAS enables ion production from solid targets via ablation and ionization with a high-powered laser pulse. The PIT source is a novel Penning ionization gauge (PIG) type source, consisting of a 0.55 T NdFeB ring magnet, cylindrical Penning trap, and low current thermal electron emitter that enables ion production via electron impact ionization of gaseous samples. For both ion sources, small bunches of ∼100 – 1000 ions can be produced from a minimal sample of source material. The ion bunches are then transported along the CHIP-TRAP beamline, where time-of-flight mass filtering can be performed before they are captured in the CHIP-TRAP Penning traps.
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Acknowledgements
This material is based upon work supported by the US Department of Energy, Office of Science, Office of Nuclear Physics under Award No. DE-SC0015927, by the National Science Foundation under Contracts No. PHY-1307233, and PHY-1607429, and by Central Michigan University. We would like to thank Georg Bollen, Ryan Ringle and other members of the LEBIT group for useful discussions on ion sources, low energy beam transport, and Penning traps.
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This article is part of the Topical Collection on Proceedings of the 7th International Conference on Trapped Charged Particles and Fundamental Physics (TCP 2018), Traverse City, Michigan, USA, 30 September-5 October 2018
Edited by Ryan Ringle, Stefan Schwarz, Alain Lapierre, Oscar Naviliat-Cuncic, Jaideep Singh and Georg Bollen
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Horana Gamage, M., Arnold, A.L., Bhandari, R. et al. Design and characterization of Ion sources for CHIP-TRAP. Hyperfine Interact 240, 93 (2019). https://doi.org/10.1007/s10751-019-1617-4
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DOI: https://doi.org/10.1007/s10751-019-1617-4