Abstract
We describe our laboratory procedures for precise measurements of lattice surface profile, where Bragg reflection takes place, of bent monocrystal wafers. A comparison of X-ray spectrometer characteristics for perfect and real crystals is presented. The described procedures will be used to measure the properties of the crystals that will be used as the dispersive elements in the future solar X-ray spectrometers SolpeX and ChemiX.
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Acton, L., Tsuneta, S., Ogawara, Y., Bentley, R., Bruner, M., Canfield, R., Culhane, L., Doschek, G., Hiei, E., Hirayama, T.: The YOHKOH mission for high-energy solar physics. Science 258, 618–625 (1992). https://doi.org/10.1126/science.258.5082.618
Acton, L.W., Finch, M.L., Gilbreth, C.W., Culhane, J.L., Bentley, R.D., Bowles, J.A., Guttridge, P., Gabriel, A.H., Firth, J.G., Hayes, R.W.: The soft X-ray polychromator for the Solar Maximum Mission. Solar Phys. 65, 53–71 (1980). https://doi.org/10.1007/BF00151384
Burek, A.: Crystals for astronomical X-ray spectroscopy. Space Sci. Instrumen. 2, 53–104 (1976)
Culhane, J.L., Hiei, E., Doschek, G.A., Cruise, A.M., Ogawara, Y., Uchida, Y., Bentley, R.D., Brown, C.M., Lang, J., Watanabe, T., Bowles, J.A., Deslattes, R.D., Feldman, U., Fludra, A., Guttridge, P., Henins, A., Lapington, J., Magraw, J., Mariska, J.T., Payne, J., Phillips, K.J.H., Sheather, P., Slater, K., Tanaka, K., Towndrow, E., Trow, M.W., Yamaguchi, A.: The Bragg Crystal Spectrometer for SOLAR-A. Solar Phys. 136, 89–104 (1991). https://doi.org/10.1007/BF00151696
Dennis, B., Milligan, R.: Solar Satellites. Scholarpedia 5 (7), 6139 (2010). https://doi.org/10.4249/scholarpedia.6139. Revision #143457
Doschek, G.A., Kreplin, R.W., Feldman, U.: High-resolution solar flare X-ray spectra. Astrophys. J. Lett. 233, L157–L160 (1979). https://doi.org/10.1086/183096
Rapley, C.G., Sylwester, J., Phillips, K.J.H.: New Results from the Solar Maximum Mission/Bent Crystal Spectrometer. Solar Phys. 292, 50 (2017). https://doi.org/10.1007/s11207-017-1070-y
Siarkowski, M., Sylwester, J., Ba̧kała, J., Szaforz, Ż., Kowaliński, M., Kordylewski, Z., Płocieniak, S., Podgórski, P., Sylwester, B., Trzebiński, W., Stȩślicki, M., Phillips, K.J.H., Dudnik, O.V., Kurbatov, E., Kuznetsov, V.D., Kuzin, S., Zimovets, I.V.: ChemiX: a Bragg crystal spectrometer for the Interhelioprobe interplanetary mission. Exp. Astron. 41, 327–350 (2016). https://doi.org/10.1007/s10686-016-9491-4
Stȩślicki, M., Sylwester, J., Płocieniak, S., Bakała, J., Szaforz, ż., Ścisłowski, D., Kowaliński, M., Hernandez, J., Kuzin, S., Shestov, S.: Soft X-ray polarimeter-spectrometer SOLPEX. In: Kosovichev, A.G., Hawley, S.L., Heinzel, P. (eds.) Solar and Stellar Flares and their Effects on Planets, IAU Symposium, vol. 320, pp 450–455 (2016). https://doi.org/10.1017/S1743921316002106
Sylwester, J., Gaicki, I., Kordylewski, Z., Kowaliński, M., Nowak, S., Płocieniak, S., Siarkowski, M., Sylwester, B., Trzebiński, W., Bakała, J., Culhane, J.L., Whyndham, M., Bentley, R.D., Guttridge, P.R., Phillips, K.J.H., Lang, J., Brown, C.M., Doschek, G.A., Kuznetsov, V.D., Oraevsky, V.N., Stepanov, A.I., Lisin, D.V.: RESIK: A bent crystal x-ray spectrometer for studies of solar coronal plasma composition. Solar Phys. 226, 45–72 (2005). https://doi.org/10.1007/s11207-005-6392-5
Sylwester, J., Kordylewski, Z., Płocieniak, S., Siarkowski, M., Kowaliński, M., Nowak, S., Trzebiński, W., Steślicki, M., Sylwester, B., Stańczyk, E., Zawerbny, R., Szaforz, ż., Phillips, K.J.H., Fárník, F., Stepanov, A.: X-ray Flare Spectra from the DIOGENESS Spectrometer and Its Concept Applied to ChemiX on the Interhelioprobe Spacecraft. Solar Phys. https://doi.org/10.1007/s11207-014-0644-1 (2015)
Tanaka, K., Watanabe, T., Nishi, K., Akita, K.: High-resolution solar flare X-ray spectra obtained with rotating spectrometers on the HINOTORI satellite. Astrophys. J. Lett. 254, L59–L63 (1982). https://doi.org/10.1086/183756
Acknowledgements
We are grateful to prof. Janusz Sylwester for his valuable comments and corrections, which have improved this article. We acknowledge financial support from the Polish National Science Center grant 2013/11/B/ST9/00234.
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Płocieniak, S., Szaforz, Ż. Laboratory characterization of bent monocrystal wafers for Bragg X-ray spectroscopy. Exp Astron 45, 255–268 (2018). https://doi.org/10.1007/s10686-018-9583-4
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DOI: https://doi.org/10.1007/s10686-018-9583-4