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Experimental Astronomy

, Volume 45, Issue 2, pp 255–268 | Cite as

Laboratory characterization of bent monocrystal wafers for Bragg X-ray spectroscopy

  • Stefan Płocieniak
  • Żaneta Szaforz
Original Article
  • 97 Downloads

Abstract

We describe our laboratory procedures for precise measurements of lattice surface profile, where Bragg reflection takes place, of bent monocrystal wafers. A comparison of X-ray spectrometer characteristics for perfect and real crystals is presented. The described procedures will be used to measure the properties of the crystals that will be used as the dispersive elements in the future solar X-ray spectrometers SolpeX and ChemiX.

Keywords

Spectroscopy X-rays Measurments Sun 

Notes

Acknowledgements

We are grateful to prof. Janusz Sylwester for his valuable comments and corrections, which have improved this article. We acknowledge financial support from the Polish National Science Center grant 2013/11/B/ST9/00234.

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Copyright information

© Springer Science+Business Media B.V., part of Springer Nature 2018

Authors and Affiliations

  1. 1.Space Research CenterPolish Academy of SciencesWarsawPoland
  2. 2.Astronomical InstituteUniversity of WrocławWrocławPoland

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