High Sensitivity Silicon Slit Detectors for 1 nm Powder XRD Size Detection Limit
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The limit of conventional X-ray powder diffraction for the detection of supported nanoparticles is usually taken to be 2–2.5 nm, at which size low signal to noise ratios make detection of particles of low weight loading and small particle size difficult. State of the art silicon strip detectors, however, are 2 orders of magnitude more sensitive than scintillation counters, and the greatly improved signal to noise ratio obtained in typical powder XRD scan times (tens of minutes to several hours) allows for the detection of much smaller nanoparticles than was previously possible. In this paper we demonstrate the use of a Si slit detector to characterize Au particles supported on carbon at sizes as small as 1.2 nm and weight loading as low as 0.33 %. At elevated scan speeds good corroboration between STEM and XRD is maintained. Thus, the latest generation XRD detector allows quick and simple access to the behaviorally rich 1–2 nm particle size range.
KeywordsHeterogeneous catalysis High-resolution electron microscopy XRD Nanoparticles Colloidal synthesis
The authors would like to acknowledge the support of the NSF for Grant CBET-1160023.
- 3.Klug HP, Alexander LE (1974) X-ray diffraction procedures: for polycrystalline and amorphous materials, 2nd edn. Wiley-VCH, New York, p 992Google Scholar
- 4.B.E. Warren (1969) X-ray diffraction. www.doverpublications.com
- 9.Haruta M, Saika K, Kobayashi T, Tsubota S, Nakahara Y (1988) Chem Express 3:159–162Google Scholar
- 22.Minacheva LK, Gladkaya AS, Sakharova V, Don G, Shchelkov R, Porai-Koshits M, Neorg Zh (1988) Khim 233:683–687Google Scholar
- 23.Barnes SE (2011) Optimization of single and bimetallic noble metal catalysts by strong electrostatic adsorption. University of Illinois, ChicagoGoogle Scholar