Cybernetics and Systems Analysis

, Volume 46, Issue 4, pp 546–553 | Cite as

Inclusion problems in trace monoids

  • K. V. Shahbazyan
  • Yu. H. Shoukourian


Efficient pattern matching algorithms for traces and their dependence graphs are proposed. Pattern matching problems related to problems of recognizing frequent patterns in structured data and counting the number of trace object windows that include a pattern are considered.


pattern matching monoid of traces dependence graph 


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Copyright information

© Springer Science+Business Media, Inc. 2010

Authors and Affiliations

  1. 1.Institute for Informatics and Automation ProblemsNational Academy of Science of the Republic of ArmeniaYerevanArmenia

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