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The Mexican hat effect on the delamination buckling of a compressed thin film

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Abstract

Because of the interaction between film and substrate, the film buckling stress can vary significantly, depending on the delamination geometry, the film and substrate mechanical properties. The Mexican hat effect indicates such interaction. An analytical method is presented, and related dimensional analysis shows that a single dimensionless parameter can effectively evaluate the effect.

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Correspondence to Yin Zhang.

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The project was supported by the National Natural Science Foundation of China (11023001 and 11372321).

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Zhang, Y., Liu, Y. The Mexican hat effect on the delamination buckling of a compressed thin film. Acta Mech Sin 30, 927–932 (2014). https://doi.org/10.1007/s10409-014-0088-8

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  • DOI: https://doi.org/10.1007/s10409-014-0088-8

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