Acta Mechanica Solida Sinica

, Volume 21, Issue 2, pp 110–115 | Cite as

Deformation Measurement Using Dual-Frequency Projection Grating Phase-Shift Profilometry

  • Yanming Chen
  • Yuming He
  • Eryi Hu
  • Hongmao Zhu


2π phase ambiguity problem is very important in phase measurement when a deformed object has a large out of plane displacement. The dual-frequency projection grating phase-shifting profilometry (PSP) can be used to solve such an issue. In the measurement, two proper-chosen frequency gratings are utilized to synthesize an equivalent wavelength grating which ensures the computed phase in a principal phase range. Thus, the error caused by the phase unwrapping process with the conventional phase reconstruct algorithm can be eliminated. Finally, experimental result of a specimen with large plastic deformation is given to prove that the proposed method is effective to handle the phase discontinuity.

Key words

dual-frequency phase-shift profilometry projection grating phase unwrapping deformation 


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Copyright information

© The Chinese Society of Theoretical and Applied Mechanics and Technology 2008

Authors and Affiliations

  1. 1.Department of MechanicsHuazhong University of Science and TechnologyWuhanChina

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