Dielectric properties of (K0.5Na0.5)NbO3–(Bi0.5Li0.5)ZrO3 lead-free ceramics as high-temperature ceramic capacitors
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Abstract
(1 − x)K0.5Na0.5NbO3–x(Bi0.5Li0.5)ZrO3 (labeled as (1 − x)KNN–xBLZ) lead-free ceramics were fabricated by a solid-state reaction method. A research was conducted on the effects of BLZ content on structure, dielectric properties and relaxation behavior of KNN ceramics. By combining the X-ray diffraction patterns with the temperature dependence of dielectric properties, an orthorhombic–tetragonal phase coexistence was identified for x = 0.03, a tetragonal phase was determined for x = 0.05, and a single rhombohedral structure occurred at x = 0.08. The 0.92KNN–0.08BLZ ceramic exhibits a high and stable permittivity (~ 1317, ± 15% variation) from 55 to 445 °C and low dielectric loss (≤ 6%) from 120 to 400 °C, which is hugely attractive for high-temperature capacitors. Activation energies of both high-temperature dielectric relaxation and dc conductivity first increase and then decline with the increase of BLZ, which might be attributed to the lattice distortion and concentration of oxygen vacancies.
Notes
Acknowledgements
This work was supported by the National Natural Science Foundation of China (nos. 11264010, 11564010, 51402196), the Natural Science Foundation of Guangxi (GA139008, 2016GXNSFDA380027), and the China Postdoctoral Science Foundation (Grants 2014M552229 and 2015T80915).
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