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Effect of thermal strain on structure and polarization fatigue of CSD-derived PbZr0.53Ti0.47O3/LaNiO3 hetero-structures

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Abstract

PbZr0.53Ti0.47O3/LaNiO3 (PZT/LNO) hetero-structures have been successfully deposited on MgO, SrTiO3, Al2O3 and Si substrate by chemical solution routes, respectively. The X-ray diffraction measurements show that out-of-plane lattice parameters of PZT increase as increase of thermal expansion coefficient of substrate. Polarization fatigues of Pt/PZT/LNO capacitors are strongly affected by the thermal strain caused by difference of thermal expansion coefficient between PZT and substrate materials. High fatigue resistance of Pt/PZT/LNO can be obtained by using substrate with similar thermal expansion coefficient as PZT.

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Authors and Affiliations

  1. Research Centre for Information Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, 1295 Dingxi Road, Shanghai, 200050, P.R. China

    G.S. Wang & X.L. Dong

  2. Institut d’Electronique de Microélectronique et de Nanotechnologie (IEMN) (UMR-CNRS 8520), Matériaux et Intégration pour la Microélectronique et les Microsystèmes, Bat. P3, Cité scientifique, Villeneuve d’Ascq, 59655, France

    G.S. Wang, D. Rémiens & E. Dogheche

Authors
  1. G.S. Wang
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  2. D. Rémiens
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  3. E. Dogheche
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  4. X.L. Dong
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Correspondence to G.S. Wang.

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PACS

77.84.Dy; 78.20.Ci; 81.20.Fw

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Wang, G., Rémiens, D., Dogheche, E. et al. Effect of thermal strain on structure and polarization fatigue of CSD-derived PbZr0.53Ti0.47O3/LaNiO3 hetero-structures. Appl. Phys. A 88, 657–660 (2007). https://doi.org/10.1007/s00339-007-4022-9

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  • DOI: https://doi.org/10.1007/s00339-007-4022-9

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