Abstract.
We study the variation of the Berman metric K(t,ζ)|dζ|2 on the Riemann surface R(t) (which varies with complex parameter t in a disk B) such that π:→B is a 2-dimensional Stein space with π−1(t)=R(t),t ∈ B. We show that log K(t,ζ)|dζ|2 is plurisubharmonic in , and apply it to give the uniformization condition for the special Stein space.
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Revised version: 18 February 2004
Mathematics Subject Classification (2000): 30C85, 30F15, 32F05, 32H10
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Maitani, F., Yamaguchi, H. Variation of Bergman metrics on Riemann surfaces. Math. Ann. 330, 477–489 (2004). https://doi.org/10.1007/s00208-004-0556-8
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DOI: https://doi.org/10.1007/s00208-004-0556-8