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Process capability index for AC transformer under electrical harmonics

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An Erratum to this article was published on 07 March 2017

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Abstract

Nowadays, the quality of electronic devices is subjected to many variables such as electrical, thermal, mechanical and environmental factors. Voltage variation induced by electrical harmonics presented in the power lines is one of the main causes for electronic products to reduce their quality and performance in an operational environment. In this study, more significant variables are addressed, and a comparative study between voltage variations with and without electrical harmonics is presented. The case study presented in this paper is based on a transformer under voltage scenarios proposed in this study. The corresponding Cpk index in the transformer was estimated using a non-normal tool. The results of the case study showed that laptop computer under electrical harmonics has a lower Cpk rank and that Cpk value impacts directly the lifetime and performance of the device.

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  • 07 March 2017

    An erratum to this article has been published.

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Authors and Affiliations

  1. Department of Industrial Engineering and Manufacturing, Institute of Engineering and Technology, Universidad Autónoma de Ciudad Juárez, Ciudad Juárez, Chihuahua, Mexico

    Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón & Roberto Romero-López

  2. Department of Electrical and Computer Engineering, Institute of Engineering and Technology, Universidad Autónoma de Ciudad Juárez, Ciudad Juárez, Chihuahua, Mexico

    Abel Eduardo Quezada-Carreón & Vicente Garcia

Authors
  1. Luis Carlos Méndez-González
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  2. Luis Alberto Rodríguez-Picón
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  3. Abel Eduardo Quezada-Carreón
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  4. Roberto Romero-López
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  5. Vicente Garcia
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Correspondence to Luis Carlos Méndez-González.

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Méndez-González, L.C., Rodríguez-Picón, L.A., Quezada-Carreón, A.E. et al. Process capability index for AC transformer under electrical harmonics. Electr Eng 100, 347–353 (2018). https://doi.org/10.1007/s00202-017-0509-3

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  • DOI: https://doi.org/10.1007/s00202-017-0509-3

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