Selective trap filling induced by electron pulse excitation during TSC measurement in PbI2
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Thermally stimulated current (TSC) measurements have been performed on samples cut from a PbI2 single crystal. After light excitation, several peaks have been observed in the range 77–320 K. It is demonstrated that excitation by means of a pulsed electron beam can be used to selectively fill either electron or hole traps. The results on PbI2 confirm that most of the observed traps can be identified as hole traps.
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