Abstract
Minute amounts of metallic as well as non-metallic inclusions significantly affect both bulk and surface properties of the electroplated gold films being used by the electronics industry. Surface effects are caused by the presence of extraneous materials diffused out from the interior to the surface, while bulk effects are brought about by the influence of inclusions on the microstructure of the gold films. This article reviews the current status of understanding of such inclusion effects in both soft and hard gold: these play essential roles in the fabrication of today's microelectronic devices.
Similar content being viewed by others
References
W.H. Safranek, ‘The Properties of Electrodeposited Metals and Alloys’, Second Edition, American Electroplaters and Surface Finishers Society, Orlando, Florida, 1986
H.A. Reinheimer,J. Electrochem. Soc., 1974,121, 490
T. Osaka, A. Kodera, T. Misato, T. Homma, Y. Okinaka and O. Yoshioka,J. Electrochem. Soc., 1997,144, 3462
‘Gold Plating Technology”, ed. F.H. Reid and W. Goldie, Electrochemical Publications, Ltd., Ayr, Scotland, 1974
W.S. Rapson and T. Groenewald, ‘Gold Usage’, Academic Press, London, 1978
F.B. Koch, Y. Okinaka, C. Wolowodiuk and D.R. Blessington,Plating, 1980,67(6), 50; 1980,67(7), 43
Y. Okinaka and F.B. Koch, ‘Proceedings of the 10th World Congress on Metal Finishing (Interfinish 80)’, 1980, pp.48–52
D.M. MacArthur,J. Electrochem. Soc., 1972,119, 672
J.D.E. McIntyre and W.F. Peck, Jr.,J. Electrochem. Soc., 1976,123, 1800
E.T. Eisenmann,J. Electrochem. Soc., 1978,125, 717
S. Nakahara and Y. Okinaka,J. Electrochem. Soc., 1981,128, 284
G. Holmbom and B.E. Jacobson,J. Electrochem. Soc., 1988,135, 787
T. Sawaguchi, T. Yamada, Y. Okinaka and K. Itaya,J. Phys. Chem., 1995,99, 14149
R. Duva and A. Simonian,US Patent 3, 562,120,1971
H.A. Reinheimer,US Patent 3,833,487, 1974
L. Greenspan,US Patent 3,423,295, 1969
R. Zimmerman and R. Brenneman,British Patent 1,275,386, 1972
S.T. Rao and R. Weil,Metal Finishing, 1979,57, 97
T.E. Dinon and H.Y. Cheh,J. Electrochem. Soc., 1992,139, 410
D.W. Endicott, H.K. James and F. Nobel,Plating and Surface Finish.,1981,68(11), 58
S. Wakabayashi, A. Murata and N. Wakabayashi,Plating and Surface Finish., 1982,69(8), 63
S. Wakabayashi, K. Harayama, S. Iwai and M. Nakazawa,Kinzoku Hyomen Gijutsu (J. Metal Finish. Soc. Japan), 1988,39, 189
A. Chinda and O. Yoshioka,Kinzoku Hyomen Gijutsu (J. Metal Finish. Soc. Japan), 1988,39, 210
Y. Okinaka, ‘Proceedings of the Symposium on Electrodeposition Technology — Theory and Practice’, ed. L.T. Romankiw and D.R. Turner, The Electrochemical Society, Inc., 1987,87–17, 147
Y. Okinaka, in ‘Precious Metals — Modern Technologies and Applications (EAST Report 1991)’, European Academy of Surface Technology, Schwäbisch Gmünd, Germany, 1991, pp. 8–18
P.A. Kohl, in ‘Modern Electroplating, Fourth Edition’, ed. M. Schlesinger and M. Paunovic, John Wiley and Sons, Inc., 2000, pp. 201–225
J. Ushio, O. Miyazawa, H. Yokono and A. Tomizawa,US Patent 4, 804, 559, 1989
T. Inoue, S. Ando, H. Okudaira, J. Ushio, A. Tomizawa, H. Takehara, T. Shimazaki, H. Yamamoto and H. Yokono, ‘Proceedings of the 45th IEEE Electronic Components Technology Conference’, 1995, p.1059
M. Kato, K. Niikura, S. Hoshino and I. Ohno,Hyomen Gijutsu (J. Surface Finish. Soc. Japan), 1991,42, 729
M. Kato, Y. Yazawa and Y. Okinaka, ‘Proceedings of AESF Technical Conference, SUR/FIN 95’, American Electroplaters and Surface Finishers Society, 1995, pp. 805–813
K. Yoshizawa, J. Sato, M. Kato, T. Misato, T. Homma, Y. Okinaka, O. Yoshioka and T. Osaka, Extended Abstract of the Paper Presented at the 101st Technical Conference of the Surface Finishing Society of Japan, 2000, Paper 23D-10
X. Wang, N. Issaev and J.G. Osteryoung,J. Electrochem. Soc., 1998,145, 974
S. Nakahara, Lucent Technologies, Private communication, 1999
C.C. Lo, J.A. Augis and M.R. Pinnel,J. Appl. Phys., 1979,50, 6887
Y. Okinaka and S. Nakahara,J. Electrochem. Soc., 1976,123, 1284
G.B. Munier,Plating, 1969,56, 1159
Ch.J. Raub, A. Knödler and J. Lendvey,Plating, 1976,63, 35
Y. Okinaka, F.B. Koch, C. Wolowodiuk and D.R. Blessington,J. Electrochem. Soc., 1978,125, 1745
B.M. Chadwick and A.G. Sharpe, in ‘Advances in Inorganic Chemistry and Radiochemistry’, Vol 8, 1966, pp.83–176
D. Kahn, ‘Proceedings of AESF Technical Conference, SUR/FIN 92’, 1992, p.305
S. Nakahara and Y. Okinaka, in ‘Properties of Electrodeposits — Their Measurements and Significance’, ed. R. Sard, H. Leidheiser, and F. Ogburn, The Electrochemical Society, Inc., 1975, pp.50–62
W. Fluehmann, F.H. Reid, R.A. Mausli and S.G. Steinemann,Plating and Surface Finish., 1980,67(6), 62
S. Nakahara,J. Electrochem. Soc., 1989,136, 451
P.K. Gallagher,Thermochim. Acta, 1980,41, 323
Ch.J. Raub,Plating and Surface Finish., 1993,80(9), 30
B. Bozzini, G. Giovanelli, S. Natali, B. Brevaglieri, P.L. Cavallotti and G. Signorelli,Engineering Failure Analysis, 1998,6, 83
P.L. Cavallotti, Private Communication, 1999.
Y. Okinaka and T. Homma, ‘Proceedings of the Third International Symposium on Electrochemical Technology Applications in Electronics’, ed. L.T. Romankiw, T. Osaka, Y. Yamazaki and C. Madore, The Electrochemical Society, Inc., 1999,99–34, 132
J.E. Graebner and Y. Okinaka,J. Appl. Phys., 1986,60(1), 36
Ch.J. Raub, Private Communication, 1992
Y. Okinaka and M. Hoshino,Gold Bull., 1998,31(1), 3
J.H. Thomas and S.P. Sharma,J. Electrochem. Soc., 1979,126, 445
R. DeDonker and J. Vanhumbeeck,Trans. Inst. Met. Finish., 1985,62(2), 59
M. Huck,Metallwiss. u. Technik, 1992,46, 132
M. Antler,Plating and Surface Finish., 1998,85(12), 85
M. Antler, Private Communication, 1989
M. Antler,IEEE Transactions on Components, Hybrids, and Manufacturing Technology,CHMT-4, No.1, 15 (1981)
J.P. Celis, J.R. Roos, W. Van Vooren and J. Vanhumbeeck,Trans. Inst. Met. Finish., 1989,67, 70
J.A. Abys, G.F. Breck, H.K. Straschil, I. Boguslavsky and G. Holmbom,Plating and Surface Finish., 1999,86(1), 108
A. Kobayashi, S. Takano and T. Kubono,Technical Reports of IEICE, 1995,EMD 95-57
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Okinaka, Y. Significance of inclusions in electroplated gold films for electronics applications. Gold Bull 33, 117–127 (2000). https://doi.org/10.1007/BF03215489
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF03215489