Lifetime measurements in Sb121
Employing delayed coincidence techniques lifetime measurements have been carried out in the decay of Te121 to decide between two alternative level schemes for Sb121. Our results support the scheme proposed by Gupta which consists of excited levels in Sb121 at 70 and 576 KeV.
KeywordsLifetime Measurement Decay Scheme Angular Correlation Measurement Delay Coincidence Method Electron Capture Branch
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