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Experimental study of negative capacitance in LEDs

  • Devices and Applications
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Abstract

The experimental study on negative capacitance (NC) of various light-emitting diodes (LEDs) is presented. Experimental result shows that all LEDs display the NC phenomenon. The voltage modulated electroluminescence (VMEL) experiment confirms that the reason of negative capacitance is the strong recombination of the injected carriers in the active region of luminescence. The measures also verify that the dependence of NC on voltage and frequency in different LEDs is similar; NC phenomenon is more obvious with higher voltage or lower frequency.

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Authors and Affiliations

  1. Department of Applied Physics, Tianjin University, 300072, Tianjin, China

    Feng Lie-feng, Wang Jun, Cong Hong-xia, Chen Yong & Wang Cun-da

  2. Department of Photoelectronics & Physics, Foshan University, 528000, Foshan, Guangdong, China

    Zhu Chuan-yun

Authors
  1. Feng Lie-feng
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  2. Wang Jun
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  3. Zhu Chuan-yun
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  4. Cong Hong-xia
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  5. Chen Yong
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  6. Wang Cun-da
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Corresponding author

Correspondence to Feng Lie-feng.

Additional information

This work is supported by the National Nature Science Foundation (Grant No. DMR-60376027)

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Feng, Lf., Wang, J., Zhu, Cy. et al. Experimental study of negative capacitance in LEDs. Optoelectron. Lett. 1, 124–126 (2005). https://doi.org/10.1007/BF03033684

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