Advertisement

Optoelectronics Letters

, Volume 1, Issue 1, pp 57–60 | Cite as

A method of simulating intensity modulation-direct detection WDM systems

  • Huang Jing 
  • Yao Jian-quan 
  • Li En-bang 
Information Optronics
  • 34 Downloads

Abstract

In the simulation of Intensity Modulation-Direct Detection WDM Systems, when the dispersion and nonlinear effects play equally important roles, the intensity fluctuation caused by cross-phase modulation may be overestimated as a result of the improper step size. Therefore, the step size in numerical simulation should be selected to suppress false XPM intensity modulation (keep it much less than signal power). According to this criterion, the step size is variable along the fiber. For a WDM system, the step size depends on the channel separation. Different type of transmission fiber has different step size. In the split-step Fourier method, this criterion can reduce simulation time, and when the step size is bigger than 100 meters, the simulation accuracy can also be improved.

CLC number

TN913.7 

Document code

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    J. Van Roey, J. Van der Donk, and P. E. Lagasse.J. Opt. Soc. Am.,71(1981), 803.CrossRefADSGoogle Scholar
  2. [2]
    J. Leibrich and W. Rosenkranz.IEEE Photon Technol Lett.,15 (2003), 395.CrossRefGoogle Scholar
  3. [3]
    G. Bosco, A. Carena, V. Curri, and R. Gaudino.IEEE Photon Technol Lett.,12(2000), 489.CrossRefGoogle Scholar
  4. [4]
    M. Plura.Electron Lett.,37(2004), 286.CrossRefGoogle Scholar
  5. [5]
    O. V. Sinkin, R. Holzohner, and J. Zweck.IEEE J. Lightwave Technol,21(2003), 61.CrossRefADSGoogle Scholar
  6. [6]
    A. V. T. Cartaxo.IEEE Photon Technol Lett.,10(1998), 1268.CrossRefGoogle Scholar
  7. [7]
    C.J. Rasmussen. OFC 2001, Anaheim, CA, 2001, Paper WDD29-1.Google Scholar
  8. [8]
    G. P. Agrawal.Nonlinear Fiber Optics, 2nd ed. San Diego, CA: Academic, 1995.Google Scholar

Copyright information

© Tianjin University of Technology 2005

Authors and Affiliations

  1. 1.School of Precision Instruments and Optoelectronics EngineeringTianjin UniversityTianJinChina
  2. 2.Applied Physics DepartmentSouth China University of TechnologyGuangzhouChina
  3. 3.School of Electrical, Computer and Telecommunications Engineering, Faculty of InformaticsUniversity of WollongongAustralia

Personalised recommendations