Proton-induced X-ray emission (PIXE) characterization of special glasses and multi-coated lenses
The manganese values for the same brand of glass made at the same manufacturing plant were analyzed by PIXE. Manganese impurity levels in A2 and A4 likely result from tin. Enhanced zirconium values on the air side for samples C and D and iron values for sample B were almost 5 times higher on the tin side than the air side. For Rutherford backscattering analysis, the fit to the thickness data by calculations obtained using SIMNRA, was very reasonable. The PIXE technique was proved to be adequate and powerful in characterizing specifications, as well as being a monitor of impurities introduced during the fabrication process, in special glasses and multi-coated lenses.
KeywordsPIXE RBS coated lens glass
Unable to display preview. Download preview PDF.
- 2.T. A. Cahill,Metals Handbook, 9th Ed., vol. 10, p. 102, American Society for Metals, Metals Park, OH (1986).Google Scholar
- 4.J. F. Shackelford, B. H. Kusko, T. A. Cahill, P. P. Bihuniak, and M. E. Hanson,Bol. Soc. Esp. Ceram,31-C-7, 111 (1992).Google Scholar
- 6.Principles and Applications of High-Energy Ion Microbeams. Hilger (eds., F. Watt and G. W. Grime), Bristol, U.K. (1987).Google Scholar
- 8.W. K. Chu, J. W. Mayer and M. A. Nicolet,Backscattering Spectrometry, Academic Press, New York (1978).Google Scholar
- 9.J. F. Shackelford, S. H. Risbud, B. H. Kusko, T. A. Cahill, P. P. Bihuniak and M. E. Hanson,Am. Ceram. Soc. Bul. 72, 100 (1993).Google Scholar
- 11.J. F. Harrison and R. A. Eldred,Adv. X-Ray Anal. 17, 560 (1973).Google Scholar