Metals and Materials International

, Volume 7, Issue 2, pp 83–89 | Cite as

Proton-induced X-ray emission (PIXE) characterization of special glasses and multi-coated lenses

  • Y. H. Han
  • T. A. Cahill
  • S. J. Kim
  • J. F. Shackelford
  • C. Castaneda


The manganese values for the same brand of glass made at the same manufacturing plant were analyzed by PIXE. Manganese impurity levels in A2 and A4 likely result from tin. Enhanced zirconium values on the air side for samples C and D and iron values for sample B were almost 5 times higher on the tin side than the air side. For Rutherford backscattering analysis, the fit to the thickness data by calculations obtained using SIMNRA, was very reasonable. The PIXE technique was proved to be adequate and powerful in characterizing specifications, as well as being a monitor of impurities introduced during the fabrication process, in special glasses and multi-coated lenses.


PIXE RBS coated lens glass 


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Copyright information

© Springer 2001

Authors and Affiliations

  • Y. H. Han
    • 1
  • T. A. Cahill
    • 1
  • S. J. Kim
    • 2
  • J. F. Shackelford
    • 1
  • C. Castaneda
    • 1
  1. 1.Department of Chemical Engineering and Materials ScienceUniversity of CaliforniaDavisUSA
  2. 2.Department of Materials Science and Metallurgical EngineeringKumoh National University of TechnologyKumiKorea

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