Skip to main content
Log in

Truncated software reliability growth model

  • Published:
Journal of Applied Mathematics and Computing Aims and scope Submit manuscript

Abstract

Due to the large scale application of software systems, software reliability plays an important role in software developments. In this paper, a software reliability growth model (SRGM) is proposed. The testing time on the right is truncated in this model. The instantaneous failure rate, mean-value function, error detection rate, reliability of the software, estimation of parameters and the simple applications of this model are discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. A.K. Sheikh, J.K. Boah, M. Younas,Truncated Extreme value model for pipeline Reliability, Reliability Engineering and system safety,25 (1989), 1–14.

    Article  Google Scholar 

  2. A.L. Goel, K. Okumoto,Time Dependent Error Detection Rate Model for Software Reliability and other performance measure, IEEE Trans. Reliab.R-28(3)(1979), 206–211.

    Article  MATH  Google Scholar 

  3. J. Musa, K. Okumoto,Software Reliability: Measurement, Predication, Application, McGraw-Hill, Inc., New York, 1987.

    Google Scholar 

  4. N. Kareer, P.K. Kapur, P.S. Grover,An S-Shaped Software Reliability Growth Models with Two types of Errors, Micro. Reliab.30(6) (1990), 1085–1090.

    Article  Google Scholar 

  5. M. Obha,Software Reliability Analysis Models, IBM. J. Res. Deve.28(4) (1984), 428–443.

    Article  Google Scholar 

  6. S. Yamada, J. Hishitani, S. Osaka,Software Reliability Measurement and Assessment based on Nonhomogenous Poisson Process Models: A Survey, Micro. Reliab.32(12) (1992), 1763–1773.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Williams, D.R.P., Vivekanandan, P. Truncated software reliability growth model. Korean J. Comput. & Appl. Math. 9, 591–599 (2002). https://doi.org/10.1007/BF03021565

Download citation

  • Received:

  • Revised:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF03021565

AMS Mathematics Subject Classification

Key words and phrases

Navigation