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An approach to active learning for classifier systems

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Abstract

In this paper, the active learning mechanism is proposed to be used in classifier systems to cope with complex problems: an, intelligent agent leaves its own signals in the environment and later collects and employs them to assist its learning process. Principles and components of the mechanism are outlined, followed by the introduction of its preliminary implementation in an actual system. An experiment with the system in a dynamic problem is then introduced, together with discussions over its results. The paper is concluded by pointing out some possible improvements that can be made to the proposed framework.

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This work was supported by the doctor training program foundation of the State Education Commission of China.

XI Haifeng was born in 1972. He received his BS and MS degrees from Tsinghua University in July 1995 and June 1997 respectively. His main research interests are distributed systems, artificial intelligence, GAs and their applications.

LUO Yupin was born in 1959. He graduated from Hunan University in 1982. He received his M.S. and Ph.D. degrees from Nagoya Institute of Technology, Japan in March 1987 and March 1990 respectively. He is now an Associate Professor of Department of Automation, Tsinghua University. His current research interests are communications network-related graph theory, distributed computing, group intelligence systems, AI and application of GAs.

YANG Shiyuan was born in Shanghai, China, in Nov. 1945. He received his B.S. and M.S. degrees from Tsinghua University in 1970 and 1981 respectively. From 1989 to 1995, he was an Associate Professor of Department of Automation, Tsinghua University. Since July 1995, he has been a Professor of the same department. He is the Co-Chairman of the Tolerant Computing Committee of China, senior member of Chinese Electronic Institute and senior member of IEEE. His current research interests are fault detection and diagnosis in digital and analog circuits, AI and its application, application of ANN to fault diagnosis, reliability design of control system and EMC of electronic equipment.

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Xi, H., Luo, Y. & Yang, S. An approach to active learning for classifier systems. J. Comput. Sci. & Technol. 14, 372–378 (1999). https://doi.org/10.1007/BF02948739

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  • DOI: https://doi.org/10.1007/BF02948739

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