Abstract
An IC test software supporting environment—ICTSSE, which supports the migration and simulation of test pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Development System (TeDS). It has the capabilities of verifying the IC’s stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format, which is the center of the TEDS, is built for test pattern migration.
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The work is supported by the Eighth-Five National Research Project of China.
Sun Yuning received his B.S. and M.S. degrees in computer engineering from Shandong University of Technology in 1989 and 1991 respectively. He received his Ph.D. degree from Institute of Computing Technology, The Chinese Academy of Sciences in 1994. Now he is a post-doctor in CASE Research Lab in Department of Computer Science and Technology, Peking University. His research interests include object-oriented software engineering, CAT and multimedia.
For the biography ofWang Xiaoming, please see p.297 of Vol.10, No.4.
Shi Wanchun received his B.S. degree from Harbin Instutite of Technology in 1958. He is the Dean of the 12th Lab in Institute of Computing Technology, The Chinese Academy of Sciences.
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Sun, Y., Wang, X. & Shi, W. ICTSSE: An object-oriented IC test software supporting environment. J. of Comput. Sci. & Technol. 10, 447–454 (1995). https://doi.org/10.1007/BF02948340
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DOI: https://doi.org/10.1007/BF02948340