Abstract
A new probabilistic testability measure is presented to ease test length analyses of random testing and pseudorandom testing. The testability measure given in this paper is oriented to signal conflict of reconvergent fanouts. Test length analyses in this paper are based on a hard fault set, calculations of which are practicable and simple. Experimental results have been obtained to show the accuracy of this test length analyser in comparison with that of Savir[6], Chin and McCluskey[8], and Wunderlich[4] by using a pseudorandom test generator combined with exhaustive fault simulation.
Similar content being viewed by others
References
R. David and K. Wagner, Analysis of detection probability and some applications.IEEE Trans. Comput., 1990, C—39 (10), 1284–1291.
H. J. Wunderlich, Self Test Using Unequiprobable Random Patterns.IEEE FTCS, 258–263, 1987.
M. Jacomino and R. David, A New Approach of Test Confidence Estimation.IEEE Test Conf., 307–314, 1989.
H. J. Wunderlich, Multiple Distributions for Biased Random Test Patterns.IEEE Test Conf., 236–244, 1988.
B. Krishnamurthy and I. G. Tollis, Improved techniques for estimating signal probabilities.IEEE Trans. Comput., 1989, C—38 (7), 1041–1045.
J. Saviret al., On Random Test Length,IEEE Test Conf., 95–105, 1983.
K. D. Wagner, C. K. Chin and E. J. McCluskey, Pseudorandom testing.IEEE Trans. Comput., 1987, C—36, 332–343.
C. K. Chin and E. J. McCluskey, Test length for pseudorandom testing.IEEE Trans. Comput., 1987, C—36, 252–256.
E. J. McCluskeyet al., Probability models for pseudorandom test sequences.IEEE Trans. CAD, 1988, CAD—7, 68–74.
Xiang Donget al., The Optimal Signal Probabilities of Primary Inputs.JFTCS, 216–220, 1989.
T. H. Chen and M. A. Breuer, Automatic design for testability via testability measures.IEEE Trans. CAD, 1985, CAD—4 (1), 3–11.
Xiang Dong, A knowledge-based design for testability.Acta Electronica Sinica, 1991, 19 (3), 106–109.
Xiang Dong,SCTM: A Signal Conflict Oriented Testability Measure, to appear inChinese Journal of Computers (in Chinese).
J. Saviret al., Random Pattern Testability.IEEE Trans. Comput., 1984, C—33, 79–90.
S. C. Seth,et al., PREDICT: A Probabilistic Estimation of a Digital Circuit Testability.IEEE FTCS, 220–225, 1985.
S. Chakravarty and H. B. Hunt, On computing signal probability and detection probability of stuck at faults.IEEE Trans. Comput., 1990, C—39, 1369–1377.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Dong, X., Daozheng, W. & Shisong, C. Probabilistic models for estimation of random and pseudo-random test length. J. of Comput. Sci. & Technol. 7, 164–174 (1992). https://doi.org/10.1007/BF02945770
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02945770