Abstract
A Product-oriented test-pattern generation strategy for Programmable Logic Arrays (PLAs) is presented. First the personality of products is discussed. Products are divided into several categories to speed up the test generation. This strategy aims at generating a very compact test set for crosspoint defects through the following steps: 1) generate special test vectors for each category of products at the beginning of test generation. Each vector is capable of detecting a great amount of crosspoint defects; 2) generate test vectors for the defects which are not covered by the tests already generated. In this step, some heuristics are employed to accelerate test generation. Based on this strategy, a PLA test—pattern generation system is developed and the experimental results are analyzed.
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Li, J., Min, Y. Product-oriented test-pattern generation for Programmable Logic Arrays. J. of Compt. Sci. & Technol. 5, 164–174 (1990). https://doi.org/10.1007/BF02943422
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DOI: https://doi.org/10.1007/BF02943422