Skip to main content
SpringerLink
Log in

GLOBAL: A design for random testability algorithm

  • Published:
Journal of Computer Science and Technology Aims and scope Submit manuscript

Abstract

A global design for testability algorithm is offered in this paper. First, a test point candidate set is obtained to simplify the test point placement problem; the principle of selective tracing is offered to get a sequential test point placement solution, which is used as the initial solution of the global algorithm. Using this initial value, abranch & bound algorithm is then offered to obtain a global design for testability solution. Finally, a new test length analyser is offered to evaluate the global design for testability.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Chen T H, Breuer M A. Automatic design for testability via testability measures.IEEE Trans. CAD, 1985, CAD-4: 3–11.

    Google Scholar 

  2. Krishnamurthy B. A dynamic programming approach to the test point insertion problem. In: 24th ACM/IEEE DAC, 695–705, 1986.

  3. Xiang Dong. A knowledge based design for testability.Acta Electronica Sinica, 1991, 19(3): 106–109.

    Google Scholar 

  4. Xiang Dong, Wei Daozheng. A global test point placement algorithm. In: Proc. of the 5-th Int. VLSI Design Conf., 227–232, IEEE Computer Society Press, Jan., 1992.

  5. Chickermane V. Patel J H. An optimization based approach to the partial scan design problem.IEEE ITC, 1987: 377–386.

  6. Cheng K T, Agrawal V D. An economical scan design for sequential logic test generation.IEEE FTCS, 1989: 28–35.

  7. Xiang Dong. SCTM: A signal conflict oriented testability measure.Chinese Journal of Computers, 16(4): 331–337.

  8. Xiang Dong, Wei Daozheng, Chen S S. Probabilistic models for estimation of random and pseudorandom test length.Journal of Computer Science & Technology, 1992, 7(2): 164–174.

    Article  Google Scholar 

  9. Hideo Fujiwara, Computational complexity of controllability/observability problems for combinational circuits.IEEE Trans. Comput., 1990, 39(6): 762–767.

    Article  MathSciNet  Google Scholar 

  10. Xiang Dong. Design for Testability and applications to test generation, Ph. D dissertation, Institute of Computing Technology, Academia Sinica, Feb., 1993.

  11. Savir J, Bardell H P. On random test length.IEEE ITC, 1983: 95–105.

  12. Wunderlich H J. Multiple distributions for biased random test patterns.IEEE ITC, 1988, 236–244.

  13. Chin C K, McCluskey E J. Test length for pseudorandom testing.IEEE Trans. Comput., 1987, C-36: 252–256.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. CAD Lab., Institute of Computing Technology, Chinese Academy of Science, 100080, Beijing

    Dong Xiang & Daozheng Wei

Authors
  1. Dong Xiang
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Daozheng Wei
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Xiang, D., Wei, D. GLOBAL: A design for random testability algorithm. J. of Compt. Sci. & Technol. 9, 182–192 (1994). https://doi.org/10.1007/BF02939500

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02939500

Keywords

Search

Navigation