Skip to main content
SpringerLink
Log in

Diffusion of Ag through Se and its effect on interferometric thickness measurement

  • Instrumentation
  • Published:
Pramana Aims and scope Submit manuscript

Abstract

The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse through Se. The thickness was measured by multiple beam fringes at reflection.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

Download references

Author information

Authors and Affiliations

  1. National Institute of Standards, Cairo, Egypt

    S Mokhtar & S Abdel-Aziz

Authors
  1. S Mokhtar
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. S Abdel-Aziz
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Mokhtar, S., Abdel-Aziz, S. Diffusion of Ag through Se and its effect on interferometric thickness measurement. Pramana - J. Phys 14, 501–507 (1980). https://doi.org/10.1007/BF02848320

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02848320

Keywords

Search

Navigation