Diffusion of Ag through Se and its effect on interferometric thickness measurement
The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse through Se. The thickness was measured by multiple beam fringes at reflection.
KeywordsSelenium films diffusion of silver interference fringes
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