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Pramana

, Volume 14, Issue 6, pp 501–507 | Cite as

Diffusion of Ag through Se and its effect on interferometric thickness measurement

  • S Mokhtar
  • S Abdel-Aziz
Instrumentation

Abstract

The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse through Se. The thickness was measured by multiple beam fringes at reflection.

Keywords

Selenium films diffusion of silver interference fringes 

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References

  1. Boltaks B I and Plachenov B T 1957Zh. Tekh. Fiz. 27 2229Google Scholar
  2. Johnson D B and Brown L C 1969J. Appl. Phys. 40 149CrossRefADSGoogle Scholar
  3. Kienel G 1955Ann. Phys. (Leipzig) 16 1ADSGoogle Scholar

Copyright information

© Indian Academy of Sciences 1980

Authors and Affiliations

  • S Mokhtar
    • 1
  • S Abdel-Aziz
    • 1
  1. 1.National Institute of StandardsCairoEgypt

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