Abstract
The previous experimental studies on transport Jc and grain boundary (micro)structure of YBa2Cu3Ox have been summarized. A novel interpretation is proposed for the transport current behavior in high-Tc superconductors. Based on extensive transport, magnetization, and electron microscopy experimental data reported previously, we show that the transport Jc(H) characteristics in high-Tc superconductors are dominated by the portion of strongly coupled regions at the grain boundaries. As a result of inhomogeneity of the grain boundaries, the coupling strength varies and causes a distribution of Jgo (inter-granular Jc) related to the fluctuations of the superconducting order parameter at the boundary area. We also discuss formation mechanisms of strongly coupled regions in bulk materials, and we present inductive methods that can be used to determine the coupling strength of a material.
Similar content being viewed by others
References
D. Shi, D.W. Capone II, G.T. Goudey, J.P. Singh, N.J. Zaluzec and K.C. Goretta,Mater. Lett. 6, 217 (1988).
D. Shi, J.G. Chen, M. Xu, A.L. Cornelius, U. Balachandran and K.C. Goretta,Supercond. Technol. 3, 222 (1990).
R.J. Cava, B. Batlogg, R.B. van Dover, D.W. Murphy, S. Sunshine, T. Siegrist, J.P. Remeika, E.A. Rietman, S. Zahurak and G.P. Espinosa,Phys. Rev. Lett. 58, 1676 (1987).
J.W. Ekin,Adv. Cer. Mater. 2, 586 (1987).
R.L. Peterson and J.W. Ekin,Phys. Rev. B 37, 9848 (1988).
R.L. Peterson and J.W. Ekin,Physica C 157, 325 (1989).
R.B. Stephens,Cryogenics 29, 399 (1989).
D. Dimos, P. Chaudhari, J. Mannhart and F.K. LeGoues,Phys. Rev. Lett. 61, 219 (1988).
S.E. Babcock, X.Y. Cai, D.L. Kaiser and D.C. Larbalestier,Nature 347, 167 (1990).
Siu-Wai Chan, D.M. Hwang, R. Ramesh, S.M. Sampere and L. Nazar,Proc. High T c Superconducting Thin Films: Processing, Characterization and Applications, ed. R. Stockbaur, (AIP New York, 1990), p. 172.
T. Van Duzer and C.W. Turner,Principles of Superconductive Devices and Circuits (Elsevier North Holland, 1981), p. 139.
T.L. Hylton and M.R. Beasley,Phys. Rev. B 39, 9042 (1989).
Yimei Zhu and M. Suenaga, preprints (1992).
B.H. Moeckly, D.K. Lathrop and R.A. Buhrman, preprint (1992).
H. Shibahara, J.P. Zhang and L.D. Marks,Ultramicroscopy 27, 185 (1989).
M. Murakami, M. Morita and N. Koyama,Jpn. J. Appl. Phys. 28, L1754 (1989).
S. Jin, T.H. Tiefel, R.C. Sherwood, M.E. Davis, R.B. van Dover, G.W. Kammlott, R.A. Fastnacht and H.D. Keith,Appl. Phys. Lett. 52, 2074 (1988).
P.J. McGinn, M. BLack and A. Valenzuela,Physica C 156, 57 (1988).
Y. Zhu, H. Zhang, H. Wang and M. Suenaga, preprint (1991).
J.G. Chen, D. Shi, C.W. Wyaman, P.J. McGinn, W.H. Chen and N. Zhu,Mater. Lett. 14, 177 (1992).
Y. Gao, G. Bai, D.J. Lam and K.L. Merkle,Physica C 173, 487 (1991).
J.E. Tkaczyk, K.W. Lay and H.R. Hart,Superconductivity and Applications, ed. Hoi S. Kwok (Plenum Pub. Corp. 1990); J.D. Livingston, A.R. Gaddipati and R.H. Arendt, preprint (1987).
J.W. Ekin, A.I. Braginski, A.J. Panson, M.A. Janocko, D.W. Capone II, N.J. Zaluzec, B. Flandermeyer, O.F. de Lima, M. Hong, J. Kwo and S.H. Liou,J. Appl. Phys. 62, 482 (1987).
J. Ekin, T.M. Larson, A.M. Hermann, Z.Z. Shen, K. Togano and H. Kumakura,Physica C 160, 489 (1989).
D. Shi, M.M. Fang, J. Akujieze, M. Xu, J.G. Chen and C. Segre,Appl. Phys. Lett. 57, 2606 (1990).
D. Shi, M. Xu, A. Umezawa and R.F. Fox,Phys. Rev. B 42, 2062 (1990).
D. Shi and S. Salem-Sugui, Jr.,Phys. Rev. B 44, 7647 (1991).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Shi, D. Factors dominating the transport critical current behavior in high-Tc superconductors. J. Electron. Mater. 22, 1211–1219 (1993). https://doi.org/10.1007/BF02818063
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02818063