Abstract
X-ray emission and IR spectroscopy data are used to elucidate the mechanism of thermal oxidation of V2S5/InP structures in oxygen. The substrate-activator interaction is shown to have a significant effect on the oxidation mechanism and to improve the engineering performance of the structures.
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Mittova, I.Y., Soshnikov, I.M., Terekhov, V.A. et al. Thermal oxidation of V2S5/InP heterostructures in oxygen. Inorg Mater 36, 975–978 (2000). https://doi.org/10.1007/BF02757971
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DOI: https://doi.org/10.1007/BF02757971