Bulletin of Materials Science

, Volume 8, Issue 1, pp 61–69 | Cite as

X-ray line profile analysis of silver base Ag-Cd-In alloys

  • S Venkat Reddy
  • S V Suryanarayana


X-ray diffraction line profiles of five silver base ternary alloys in α-phase with varying atomic percentages of cadmium and indium were recorded in both cold-worked and annealed states of the samples. Detailed studies on the profiles involving peak shift, peak asymmetry and Fourier analysis of line shapes have been carried out to evaluate microstructural parameters such as deformation fault probabilities,rms strains and dislocation densities. It was found that the addition of indium has a marked effect in producing deformation fault probabilities in comparison to that of adding cadmium in ternary silver base alloys. Compound fault probability was found to be maximum for the alloy Ag-10Cd-15In.


Microstructure line profile analysis cold-worked state silver base ternary alloys stacking fault probabilities 


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Copyright information

© Indian Academy of Sciences 1986

Authors and Affiliations

  • S Venkat Reddy
    • 1
    • 2
  • S V Suryanarayana
    • 1
  1. 1.Department of PhysicsUniversity College of Science, Osmania UniversityHyderabadIndia
  2. 2.Sardar Patel CollegeSecunderabadIndia

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