Advertisement

Bulletin of Materials Science

, Volume 8, Issue 1, pp 61–69 | Cite as

X-ray line profile analysis of silver base Ag-Cd-In alloys

  • S Venkat Reddy
  • S V Suryanarayana
Article

Abstract

X-ray diffraction line profiles of five silver base ternary alloys in α-phase with varying atomic percentages of cadmium and indium were recorded in both cold-worked and annealed states of the samples. Detailed studies on the profiles involving peak shift, peak asymmetry and Fourier analysis of line shapes have been carried out to evaluate microstructural parameters such as deformation fault probabilities,rms strains and dislocation densities. It was found that the addition of indium has a marked effect in producing deformation fault probabilities in comparison to that of adding cadmium in ternary silver base alloys. Compound fault probability was found to be maximum for the alloy Ag-10Cd-15In.

Keywords

Microstructure line profile analysis cold-worked state silver base ternary alloys stacking fault probabilities 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Adler R P I and Wagner C N J 1962J. Appl. Phys. 33 3451CrossRefGoogle Scholar
  2. Anantharaman T R, Rama Rao P and Lele S 1972 Recent developments in metallurgical Science and Technology, Silver Jubilee Symposium, Indian Institute of Metals, New DelhiGoogle Scholar
  3. Bearden J A 1933Phys. Rev. 43 92CrossRefGoogle Scholar
  4. Chatterjee S K, Halder S K and Sen Gupta S P 1976J. Appl. Phys. 47 411CrossRefGoogle Scholar
  5. Chatterjee S K, Halder S K and Sen Gupta S P 1977J. Appl. Phys. 48 1442CrossRefGoogle Scholar
  6. Cohen J B and Wagner C N J 1962J. Appl. Phys. 33 2073CrossRefGoogle Scholar
  7. De M 1969J. Appl. Crystallogr. 2 82CrossRefGoogle Scholar
  8. Delehouzee L and Deruyttere A 1967Act. Metall. 15 727CrossRefGoogle Scholar
  9. Halder S K, De M and Sen Gupta S P 1977J. Appl. Phys. 48 3560CrossRefGoogle Scholar
  10. Krishnan R G, Gupta R K and Rama Rao P 1971Metall. Trans. 2 3373Google Scholar
  11. Liu Y C and Gallaghar P C J 1971J. Appl. Phys. 42 3322CrossRefGoogle Scholar
  12. Paterson M S 1952J. Appl. Phys. 23 805CrossRefGoogle Scholar
  13. Reddy S V and Suryanarayana S V 1983J. Appl. Phys. 54 6317CrossRefGoogle Scholar
  14. Reddy S V and Suryanarayana S V 1984Indian J. Pure Appl. Phys. 22 161Google Scholar
  15. Sen Gupta S P 1967Acta. Crystallogr. 23 244CrossRefGoogle Scholar
  16. Sen Gupta S P and Goswami K N 1967Acta Crystallogr. 22 81CrossRefGoogle Scholar
  17. Sen Gupta S P and De M 1970J. Appl. Crystallogr. 3 410CrossRefGoogle Scholar
  18. Snyder H J 1966 Ph.D. Thesis, University of Pittsburgh, USAGoogle Scholar
  19. Stokes A R 1948Proc. Phys. Soc. (London) 61 382CrossRefGoogle Scholar
  20. Wagner C N J 1966 Local atomic arrangements studied by x-ray diffraction (New York: Gordon and Breach)Google Scholar
  21. Warren B E 1959Progr. Metal Phys. 8 147CrossRefGoogle Scholar
  22. Warren B E 1961J. Appl. Phys. 32 2428CrossRefGoogle Scholar
  23. Warren B E 1969 X-ray diffraction (New York: Addison-Wesley)Google Scholar
  24. Warren B E and Averbach B L 1950J. Appl. Phys. 21 595CrossRefGoogle Scholar
  25. Williamson G K and Smallman R E 1956Philos. Mag. 1 34CrossRefGoogle Scholar
  26. Wilson A J C 1962Nature (London) 193 568CrossRefGoogle Scholar

Copyright information

© Indian Academy of Sciences 1986

Authors and Affiliations

  • S Venkat Reddy
    • 1
    • 2
  • S V Suryanarayana
    • 1
  1. 1.Department of PhysicsUniversity College of Science, Osmania UniversityHyderabadIndia
  2. 2.Sardar Patel CollegeSecunderabadIndia

Personalised recommendations