Analytical electron microscopy of aluminium alloys
- 56 Downloads
X-ray microanalysis and electron energy loss spectroscopy of thin foils constitute the important techniques of high resolution chemical analysis using the electron microscope. The technique of x-ray microanalysis is discussed in this paper with particular emphasis on the study of aluminium alloys using a dedicated scanning transmission electron microscope (stem).
The principle of determining chemical composition from observed x-ray peak intensities including the absorption of x-rays and beam broadening in thin foils are considered. The accuracy of peak intensity measurement and detection limits in x-ray microanalysis are illustrated with reference to Al-Mn alloys. The Cliff-Lorimer (k) factors for manganese, iron and copper with respect to aluminium were obtained from standard samples. Identification of phases in 1100 and 1200 aluminium and 3008 (Al-Mn-Zr) alloy were carried out from measured intensities of x-ray peaks. The experimental results emphasize the value of developing techniques for extracting the particles from the aluminium matrix. The transition phases formed in Al-6%Zn-3%Mg and Al-4% Cu were investigated by micro-diffraction and x-ray microanalysis.
KeywordsHigh resolution analysis x-ray microanalysis aluminium alloy phase identification metastable phases
Unable to display preview. Download preview PDF.
- Cliff G and Lorimer G W 1975J. Microsc. 103 203Google Scholar
- Cowley J M 1982National Seminar on high resolution and analytical microscopy (Kalpakkam)Google Scholar
- Goldstein J I, Costley J L, Lorimer G W and Read S J B 1977 (ed) O Johari (Chicago: IITRI) p. 315Google Scholar
- Heinrich K F J 1966The electron microprobe (eds) T D McKinley, K F J Heinrich and D B Wittry (New York: Wiley) p. 296Google Scholar
- Jones I P and Loretto M H 1981J. Microsc. 124 3Google Scholar
- Joy D C 1981J. Microsc. 124 37Google Scholar
- Keyser D F 1979Introduction to analytical electron microscopy (eds) J J Hren, J I Goldstein and D C Joy (New York: Plenum Press) p. 199Google Scholar
- Oppolzer H and Knauer V 1979Scanning electron microscopy (ed) O Johari (Chicago: SEM Inc) 111Google Scholar
- Philibert J and Tixier R 1968J. Appl. Phys. 1 685Google Scholar
- Porter D A and Westengen H 1981Quantitative microanalysis with high spatial resolution (London: Metals Society) p. 94Google Scholar
- Schreiber T P and Wims A M 1981Ultramicroscopy 6 323Google Scholar
- Tixier R and Philibert J 1969Proc. 5th int. conf. on x-ray optics and microanalysis (eds) G Molleustedt and K H Garukler (Berlin: Springer Verlag) p. 180Google Scholar
- Woods J, Williams D B and Goldstein J I 1981Quantitative microanalysis with high spatial resolution (London: The Metals Society) p. 24Google Scholar
- Zaluzec N J 1979Introduction to analytical electron microscopy (eds) J J Hren, J I Goldstein and D C Joy (New York: Plenum) p. 121Google Scholar