Spatial symmetries of valence band structures by angularly resolved X-ray photoelectron spectroscopy

Summary

Angularly resolved high-energy (hv=1500 eV) photoemission measurements are shown to give direct information about the partial symmetry of valence orbitals. In particular, regions ofp _z ,p _x,y and$d_{z^2 }$ character are identified in the valence density of states of the layered compounds GaSe, SnSe₂ and MoS₂, respectively.

Riassunto

Si mostra che le misure di fotoemissione ad altra energia (hv=1500 eV) risolte in angolo danno informazioni dirette sulla simmetria spaziale degli orbitali di valenza. In particolare, si identificano regioni di caratterep _z ,p _x,y ,$d_{z^2 }$ nella densità degli stati di valenza dei composti a strati GaSe, SnSe₂ e MoS₂, rispettivamente.

Резюме

Измерения высокоэнергетической фотоэмиссии, разрешенной по углам, дают вепосредственную информацию о пространственной симметрии валентных орбиталей. Устанавливается природа состояний слоистых соединений GaSe, SnSe₂ и MoS₂.