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Some spectral response characteristics of ZnTe thin films

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Abstract

Zinc telluride thin films have been grown at room temperature and higher temperature substrates by thermal evaporation technique in a vacuum of 10-6 torr. A main peak in the photocurrent is observed at 781 nm (1.58 eV) with two lower amplitude peaks on the lower wavelength side and one on higher wavelength side. The evaluated thermal activation energy is found to correspond well with the main spectral peak. From these studies it can be inferred that temperatures up to 453 K is still in the extrinsic conductivity region of the studied ZnTe thin films.

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Authors and Affiliations

  1. Department of Physics, Gauhati University, 781 014, Guwahati, India

    R. Sarma, N. Mazumdar & H. L. Das

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  1. R. Sarma
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  2. N. Mazumdar
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  3. H. L. Das
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Correspondence to H. L. Das.

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Sarma, R., Mazumdar, N. & Das, H.L. Some spectral response characteristics of ZnTe thin films. Bull Mater Sci 29, 15–16 (2006). https://doi.org/10.1007/BF02709348

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  • DOI: https://doi.org/10.1007/BF02709348

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