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This article is adapted from an article of the same name that originally appeared in Electronic Device Failure Analysis, ASM International, 2006, 8(1), pp. 25–28.
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Burgess, D.L. Lessons from Sudoku. JFAP 6, 35–38 (2006). https://doi.org/10.1007/BF02692326
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DOI: https://doi.org/10.1007/BF02692326