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Characterization of strongly exposed points inL 2 (T, X)

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Novosibirsk. Translated fromSibirskiî Matematicheskiî Zhurnal, Vol. 41, No. 3, pp. 692–695, May–June, 2000.

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Suslov, S.I. Characterization of strongly exposed points inL 2 (T, X) . Sib Math J 41, 575–577 (2000). https://doi.org/10.1007/BF02674113

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  • DOI: https://doi.org/10.1007/BF02674113

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