Abstract
A geometrically nonlinear analysis was proposed for the deformation of a free standing elastically isotropic wafer caused by the surface stress change on one surface. The link between the curvature and the change in surface stress was obtained analytically from energetic consideration. In contrast to the existing linear analysis, a remarkable consequence is that, when the wafer is very thin or the surface stress difference between the two major surfaces is large enough, the shape of the wafer will bifurcate.
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Koch R. The intrinsic stress of polycrystalline and epitaxial thin metal films[J].J Phys Condens Matter, 1990,6(48): 9519–9550.
Cammarata R C. Surface and interface stress effects in thin films[J].Prog Surf Sci, 1994,46(1): 1–38.
Ibach H. The role of surface stress in reconstruction, epitaxial growth and stabilization of mesoscopic structures[J].Surf Sci Rep, 1997,29(5/6): 195–263.
Sander D. The correlation between mechanical stress and magnetic anisotropy in ultrathin films[J].Rep Prog Phys, 1999,62(5): 809–858.
Spaepen F. Interfaces and stresses in thin films[J].Acta Mater, 2000,48(1): 31–42.
Stoney G G. The tension of metallic films deposited by electrolysis[J].Proc Roy Soc Lond, 1909,A82: 172–178.
Dahmen K, Lehwald S, Ibach H. Bending of crystalline plates under the influence of surface stress—a finite element analysis[J].Sur Sci, 2000,446(1/2): 161–173
He L H, Lim C W. On the bending of unconstrained thin crystalline plates caused by the change in surface stress[J].Sur Sci, 2001,478(3): 203–210.
Sader J E. Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: rectangular plates[J].J Appl. Phys, 2001,89(5): 2911–2921.
Sader J E. Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: V-shaped plates[J].J Appl. Phys, 2002,91(11): 9354–9361.
Timoshenko S P, Woinowsky-Krieger S.Theory of Plates and Shells[M]. New York: McGraw-Hill, 1959.
Hyer M W. The room-temperature shape of four-layer unsymmetric cross-ply laminates[J].J Compos Mater, 1982,16: 318–323.
Masters C B, Salamon N J. Geometrically nonlinear stress-deflection relations for thin film/substrate systems[J].Int J Engng Sci, 1993,31(6): 915–925.
Haiss W. Surface stress of clean and adsorbate-covered solids[J].Rep Prog Phys, 2001,64(5): 591–648.
Leiva E P M, Del Popolo M G, Schmickler W. Changes in surface stress caused by the adsorption of an epitaxial metal monolayer[J].Chem Phy Lett, 2000,320(5/6): 393–397.
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Contributed by Lupiu Ren-huai
Biography: Yupan Kun (1979≈)
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Kun, Y., Ling-hui, H. & Ren-huai, L. Shape bifurcation of an elastic wafer due to surface stress. Appl Math Mech 24, 1141–1146 (2003). https://doi.org/10.1007/BF02438103
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DOI: https://doi.org/10.1007/BF02438103