Abstract
Theoretical equations for the galvanomagnetic parameters of thin polycrystalline metal films are derived within the frameworks of the Soffer-Cottey model for electron scattering at rough surfaces and of the three-dimensional model for electron scattering at grain boundaries. Influences of the surface roughness and of the strength of the transverse magnetic field are investigated, showing the absence of oscillations in the transport parameters with increasing magnetic field even for very thin films with rough surfaces. In the limits of small reduced thicknesses and weak magnetic fields, analytical expressions for the Hall coefficient and for the electrical conductivity are proposed in order to provide an easier experimental determination of the roughness and grain parameters.
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Tellier, C.R. A Soffer-Cottey model for the galvanomagnetic properties of thin polycrystalline metal films. J Mater Sci 26, 1421–1430 (1991). https://doi.org/10.1007/BF00544649
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DOI: https://doi.org/10.1007/BF00544649