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Characterization of Pb(Zr, Ti)O3 thin films obtained by MOD

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Abstract

Pb(Zr, Ti)O3 thin films were deposited by dip-coating on polycrystalline alumina substrates by using an MOD method. The thickness and homogeneity of the films were measured as a function of dip rates and solution concentration. Heating and cooling schedules determined the main structure of the crystallized films. Rheology measurements and Fourier transform-infrared spectra were carried out to obtain a better knowledge of the solution features. A microstructural development study and some ferroelectric measurements were also carried out.

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Authors and Affiliations

  1. Electroceramics Department, Instituto de Cerámica y Vidrio (CSIC), Arganda del Rey, 28500, Madrid, Spain

    E. Nieto, J. F. Fernandez, C. Moure & P. Duran

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  1. E. Nieto
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  2. J. F. Fernandez
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  3. C. Moure
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  4. P. Duran
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Nieto, E., Fernandez, J.F., Moure, C. et al. Characterization of Pb(Zr, Ti)O3 thin films obtained by MOD. Journal of Materials Science 30, 6243–6248 (1995). https://doi.org/10.1007/BF00369672

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  • DOI: https://doi.org/10.1007/BF00369672

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