Abstract
Microstructures of c-axis oriented YBCO thin films made by high-pressure d.c. sputtering on LaAlO3 and MgO substrates were examined by TEM. The a-axis oriented grains, second phases and micro-twins were frequently observed in the film. The a-axis oriented grains expanded along their c-axis directions during film growth. The a- and b-axis misorientations were observed in the film on MgO due to serious lattice mis-match between YBCO and MgO. The second phases were often accompanied with a-axis oriented grains suggesting they act as nuclei. These observed results were correlated with the measured T c and J c of the films.
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Li, Y.H., Leach, C., Li, Y. et al. Microstructure and electrical properties of YBCO thin films. JOURNAL OF MATERIALS SCIENCE 30, 3968–3972 (1995). https://doi.org/10.1007/BF00360695
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DOI: https://doi.org/10.1007/BF00360695